A. Joannou, D. Pentz, J. D. van Wyk, A. D. de Beer
{"title":"高频电力电子变换器中小型化测量分流的若干考虑","authors":"A. Joannou, D. Pentz, J. D. van Wyk, A. D. de Beer","doi":"10.1109/EPE.2014.6910901","DOIUrl":null,"url":null,"abstract":"Power semi-conductors are able to achieve switching transients within a few nanoseconds and possibly even faster. These fast switching transients will need to be measured and analyzed thoroughly. In this paper four different types of shunt constructions and installations are tested on the same power electronics circuit, giving widely diverse results. Interpreting and analyzing these measurement results will assist in developing accurate current measurement devices for fast switching transient power electronic converters of the future.","PeriodicalId":6508,"journal":{"name":"2014 16th European Conference on Power Electronics and Applications","volume":"26 1","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2014-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Some considerations for miniaturized measurement shunts in high frequency power electronic converters\",\"authors\":\"A. Joannou, D. Pentz, J. D. van Wyk, A. D. de Beer\",\"doi\":\"10.1109/EPE.2014.6910901\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power semi-conductors are able to achieve switching transients within a few nanoseconds and possibly even faster. These fast switching transients will need to be measured and analyzed thoroughly. In this paper four different types of shunt constructions and installations are tested on the same power electronics circuit, giving widely diverse results. Interpreting and analyzing these measurement results will assist in developing accurate current measurement devices for fast switching transient power electronic converters of the future.\",\"PeriodicalId\":6508,\"journal\":{\"name\":\"2014 16th European Conference on Power Electronics and Applications\",\"volume\":\"26 1\",\"pages\":\"1-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-09-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 16th European Conference on Power Electronics and Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPE.2014.6910901\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 16th European Conference on Power Electronics and Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPE.2014.6910901","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Some considerations for miniaturized measurement shunts in high frequency power electronic converters
Power semi-conductors are able to achieve switching transients within a few nanoseconds and possibly even faster. These fast switching transients will need to be measured and analyzed thoroughly. In this paper four different types of shunt constructions and installations are tested on the same power electronics circuit, giving widely diverse results. Interpreting and analyzing these measurement results will assist in developing accurate current measurement devices for fast switching transient power electronic converters of the future.