{"title":"液体中细胞或胶体颗粒的计数和大小的电子门检测:前端特征，具体问题及其补救。第二部分:实验","authors":"F. Bisschop","doi":"10.1109/IMTC.2005.1604384","DOIUrl":null,"url":null,"abstract":"Occurring jet flow and turbulence in the output compartment of gate detectors constitute presumed causes of fluctuating gate impedance and of dominant noise. Experiments with a dedicated detector, to some extent, confirm that presumption but also show a noticeable impact of configurational and hydrodynamic parameters","PeriodicalId":93508,"journal":{"name":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2005-05-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Electronic Gate Detection for the Counting and Sizing of Cells or Colloidal Particles in Liquids: Front-End Characteristics, Specific Problems and their Remediation. Part 2: Experimental\",\"authors\":\"F. Bisschop\",\"doi\":\"10.1109/IMTC.2005.1604384\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Occurring jet flow and turbulence in the output compartment of gate detectors constitute presumed causes of fluctuating gate impedance and of dominant noise. Experiments with a dedicated detector, to some extent, confirm that presumption but also show a noticeable impact of configurational and hydrodynamic parameters\",\"PeriodicalId\":93508,\"journal\":{\"name\":\"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-05-16\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.2005.1604384\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"... IEEE International Instrumentation and Measurement Technology Conference. IEEE International Instrumentation and Measurement Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.2005.1604384","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Electronic Gate Detection for the Counting and Sizing of Cells or Colloidal Particles in Liquids: Front-End Characteristics, Specific Problems and their Remediation. Part 2: Experimental
Occurring jet flow and turbulence in the output compartment of gate detectors constitute presumed causes of fluctuating gate impedance and of dominant noise. Experiments with a dedicated detector, to some extent, confirm that presumption but also show a noticeable impact of configurational and hydrodynamic parameters
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