质子辐照PI膜中的电荷积累现象

H. Miyake, R. Uchiyama, S. Numata, Y. Tanaka, T. Takada
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引用次数: 0

摘要

利用空间电荷分布和电流测量结果,对高能质子辐照下航天器用多层绝缘体(Multi Layer Insulator,一种隔热材料)的介电特性进行了评价。航天器因静电放电事故造成严重的损坏。由于放射性射线,特别是电子和质子的作用,电荷在聚合物材料中积累。这些电荷成为老化和放电现象的根源。这些充放电现象成为航天器运行异常的触发因素。因此,我们需要得到它的电学性质。基于上述原因,我们采用PEA方法研究了介电体中的空间电荷积累现象。在这项研究中,我们特别关注了聚酰亚胺(PI)薄膜在高能质子照射下的MLI。许多研究者研究了几种不同能量电子束辐照介质材料的充电现象,但对质子辐照介质材料的充电特性却没有进行研究。因此,我们特别关注质子辐照下高分子材料的内部充电现象。结果表明,正电荷在质子穿透深度处聚集。在辐照过程中,累积电荷随辐照电流密度的增大而减小。我们认为这种现象的起源是由RIC产生的。为了证实我们基于PEA测量的预测,我们还使用ASTM方法获得了质子辐照的PI块体的电导率。本文从上述结果出发,讨论并估计了质子辐照后PI膜的介电性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Charge accumulation phenomena in PI film irradiated by a proton
We evaluate the dielectric characteristic of polymeric materials for MLI (Multi Layer Insulator, a kind of thermal insulation material) for spacecraft under high energy proton irradiation using the results of space charge distribution and current measurement. Spacecraft have a serious damage due to the electrostatic discharge accident. The electric charges are accumulated in the polymeric materials due to radioactive rays, especially electrons and protons. Those charges become the origin of aging and discharging phenomena. Furthermore, those charging and discharging phenomena becomes a trigger for spacecraft operation anomaly. Therefore, we need to obtain the electric property. From the above reason, we have studied space charge accumulation phenomena in the dielectric bulks using PEA method. In this study, we especially focused polyimide (PI) films for MLI irradiated by high energy proton. While many researchers have studied to discuss the charging phenomena in several dielectric materials irradiated by e-beam with several energies, the charging characteristic in those materials irradiated by proton was not treated. Therefore, we especially focused on an internal charging phenomena in polymeric materials irradiated by a proton. From the results, it is found that positive charges accumulate in the bulk at the position of proton penetration depth. We also have tendency that accumulated charges decreased during the irradiation depended on irradiation current density. We thought that the origin of the phenomenon is produced by RIC. Concerning the confirmation of our prediction based on PEA measurement, we also obtained the conductivity in the PI bulks irradiated by proton using ASTM method. From the above our results, we discuss and estimate the dielectric properties of the PI films irradiated by proton in this paper.
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