半导体、硅和锗中Shuffle螺位错的性质

Huili Zhang, Chun Zhang, C. Zeng, Lumei Tong
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引用次数: 1

摘要

用改进的P-N理论计算了Si和Ge中shuffle螺位错的宽度、Peierls势垒和应力。计算宽度约为0.6b, b为Burgers向量。Si和Ge中shuffle螺位错的Peierls势垒分别为3.61~4.61meV/A和5.31~13.32meV/A, Peierls应力分别为1.40~2.07 meV/ a3和1.93~3.29 meV/ a3。我们的计算结果可能对应于以两个原子之间的键为中心的shuffle螺位错的亚稳核心。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
The Properties of Shuffle Screw Dislocations in Semiconductors Siliconand Germanium
The width, Peierls barrier and stress for shuffle screw dislocation in Si and Ge have been calculated by the improved P-N theory. The calculated widths are about 0.6b, b is the Burgers vector. The Peierls barriers for shuffle screw dislocations in Si and Ge are respectively about 3.61~4.61meV/A and 5.31~13.32meV/A, Peierls stresses are 1.40~2.07 meV/A 3 and 1.93~3.29 meV/A 3 . Our calculated results may correspond to the metastable core of the shuffle screw dislocation which is centred on the bond between two atoms.
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