NTRP:采用SystemC验证库的基于非侵入式时序随机化探针的被测件测试新方法

Nishit Gupta, Sunil Alag
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引用次数: 0

摘要

为了满足片上系统(SoC)快速变化的计算需求,片上互连总线规范从单通道单向、串行、有序、共享总线通信系统不断发展到复杂的多通道、基于突发、无序、独立的读/写/地址总线通信系统。这导致了几种行业标准验证方法的发展,这些方法使用硬件描述语言,特别是像通用验证方法(UVM)这样的系统Verilog,促进了基于约束随机化的刺激生成和功能覆盖。采用这样的方法涉及到它的诀窍,以适应,重复的许可费用和模拟开销。针对测试下设计(DUT)的压力测试,提出了一种基于系统验证(SCV)库的总线周期精确非侵入式时序随机化探针(NTRP)的新方法。根据实证结果,本文提出的使用NTRP的注释造成的开销很小,但为在DUT接口上添加时序延迟提供了方便的方法,其中包括其他优点,特别是交易重新排序以更好地利用总线,接口信号时序的选择性约束随机化,自检的记分板,很少的模拟开销和无许可条款,基于开源SCV,使其便于用于DUT测试。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
NTRP: Novel approach for DUT testing based on nonintrusive timing randomization probes using SystemC verification library
To meet the rapidly transforming computing requirement of System on Chip (SoC), On-Chip Interconnect BUS specifications is been evolved continuously from single-channel one-way, serial, in-order, shared BUS communication system to complex multi-channel, burst based, out-of-order, separate read/ write/ address BUS communication system. This resulted in development of several industry standard verification methodologies using Hardware Description Languages particularly System Verilog like Universal Verification Methodology (UVM) facilitating constrained randomization based stimulus generation and functional coverage. Adopting such methodologies involves its know-how to get accustomed, recurring licensing charges and simulation overhead. In this work, for stress testing of Design Under Test (DUT), a novel approach is proposed based on Bus Cycle Accurate Nonintrusive Timing Randomization Probes (NTRP) using SystemC Verification (SCV) Library. Based on empirical results, it is argued that the annotations proposed in the work using NTRP causes little overhead, however provides convenient approach for adding timing delays to the interface of DUT including other advantages particularly — transactions reordering for better BUS utilization, selective constrained randomization on interface signal timing, score boarding for self-checking, little simulation overheads and no licensing terms, being based on Open Source SCV, makes it convenient to adopt for DUT testing.
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