柔性高阻抗表面的物理实现和反射相位特性

A. C. Durgun, C. Balanis, C. Birtcher
{"title":"柔性高阻抗表面的物理实现和反射相位特性","authors":"A. C. Durgun, C. Balanis, C. Birtcher","doi":"10.1109/APS.2011.5996856","DOIUrl":null,"url":null,"abstract":"This paper presents the fabrication and reflection phase measurements of a flexible high impedance surface (FHIS). The surface is fabricated by using DuPont pyralux polyimide as the substrate. Cyanoacrylate is used to adhere the samples of polyimide. The reflection phase response of the FHIS, which is curved in the form of a cylinder, is measured in the anechoic chamber and compared with that of the flat FHIS. As expected, reflection phase characteristics of the curved FHIS are polarization dependent and slightly different than those of the flat one. The measured reflection phase characteristics of the curved FHIS will be compared with simulations which presently are under consideration.","PeriodicalId":6449,"journal":{"name":"2011 IEEE International Symposium on Antennas and Propagation (APSURSI)","volume":"37 1","pages":"1844-1847"},"PeriodicalIF":0.0000,"publicationDate":"2011-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":"{\"title\":\"Physical realization and reflection phase characteristics of a flexible high impedance surface\",\"authors\":\"A. C. Durgun, C. Balanis, C. Birtcher\",\"doi\":\"10.1109/APS.2011.5996856\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the fabrication and reflection phase measurements of a flexible high impedance surface (FHIS). The surface is fabricated by using DuPont pyralux polyimide as the substrate. Cyanoacrylate is used to adhere the samples of polyimide. The reflection phase response of the FHIS, which is curved in the form of a cylinder, is measured in the anechoic chamber and compared with that of the flat FHIS. As expected, reflection phase characteristics of the curved FHIS are polarization dependent and slightly different than those of the flat one. The measured reflection phase characteristics of the curved FHIS will be compared with simulations which presently are under consideration.\",\"PeriodicalId\":6449,\"journal\":{\"name\":\"2011 IEEE International Symposium on Antennas and Propagation (APSURSI)\",\"volume\":\"37 1\",\"pages\":\"1844-1847\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-07-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"6\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Symposium on Antennas and Propagation (APSURSI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/APS.2011.5996856\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Symposium on Antennas and Propagation (APSURSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APS.2011.5996856","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

摘要

本文介绍了柔性高阻抗表面的制作和反射相位测量。该表面采用杜邦pyralux聚酰亚胺作为衬底制备。氰基丙烯酸酯用于粘接聚酰亚胺样品。在消声室中测量了弯曲圆柱形FHIS的反射相位响应,并与平面FHIS的反射相位响应进行了比较。正如预期的那样,弯曲FHIS的反射相位特性与偏振有关,并且与平坦FHIS的反射相位特性略有不同。将测量到的弯曲FHIS反射相位特性与目前正在考虑的模拟结果进行比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Physical realization and reflection phase characteristics of a flexible high impedance surface
This paper presents the fabrication and reflection phase measurements of a flexible high impedance surface (FHIS). The surface is fabricated by using DuPont pyralux polyimide as the substrate. Cyanoacrylate is used to adhere the samples of polyimide. The reflection phase response of the FHIS, which is curved in the form of a cylinder, is measured in the anechoic chamber and compared with that of the flat FHIS. As expected, reflection phase characteristics of the curved FHIS are polarization dependent and slightly different than those of the flat one. The measured reflection phase characteristics of the curved FHIS will be compared with simulations which presently are under consideration.
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