U. Khalid, J. Anwer, Narinderjit Singh, N. H. Hamid, V. Asirvadam
{"title":"基于概率计算方案的数字电路可靠性评估","authors":"U. Khalid, J. Anwer, Narinderjit Singh, N. H. Hamid, V. Asirvadam","doi":"10.1109/NATPC.2011.6136386","DOIUrl":null,"url":null,"abstract":"The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit's reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth'93 circuits.","PeriodicalId":6411,"journal":{"name":"2011 National Postgraduate Conference","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"Reliability-evaluation of digital circuits using probabilistic computation schemes\",\"authors\":\"U. Khalid, J. Anwer, Narinderjit Singh, N. H. Hamid, V. Asirvadam\",\"doi\":\"10.1109/NATPC.2011.6136386\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit's reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth'93 circuits.\",\"PeriodicalId\":6411,\"journal\":{\"name\":\"2011 National Postgraduate Conference\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 National Postgraduate Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NATPC.2011.6136386\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 National Postgraduate Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NATPC.2011.6136386","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Reliability-evaluation of digital circuits using probabilistic computation schemes
The reliability is one of the serious issues confronted by microelectronics industry as feature sizes scale down to nano-design level. In this paper, we are providing the analysis to find the accurate and efficient method of finding circuit's reliability among the available options. The experimental results provide the reliability evaluation of few probabilistic computation schemes. The comparison will be done on unique platform to choose the best scheme amongst all. The simulations have been conducted on small test digital circuits including LGSynth'93 circuits.
求助内容：
应助结果提醒方式：
京公网安备 11010802042870号
