高排列单壁碳纳米管薄膜电导率的理论建模与实验验证

M. Amer, Mark J. Foster, Ali M. Al Mafrage, Mohammed K. Mohammed
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引用次数: 0

摘要

建立了一种能够准确预测高排列单壁碳纳米管薄膜电导率的新模型。这些薄膜的厚度在1到11层之间。成熟的层压理论无法预测不同厚度薄膜的实验测量值。然而,该模型基于层压理论领域内的改进和扩展技术,可以考虑到对纳米薄膜的性能和性能至关重要的层间相互作用,预测出精确的值。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Theoretical modeling and experimental validation of Electrical conductivity for highly aligned single-walled carbon nanotube thin films
A new model capable of accurately predicting the electrical conductivity of highly aligned single-walled carbon nanotube thin films has been developed. The films ranged between 1 and 11 layers thick. The well-established Lamination theory failed to predict the experimentally measured values for the films of different thicknesses. However, this model, based on modified and expanded techniques applied within the realm of the lamination theory, could predict the exact values taking into consideration the inter-layer interaction that is crucial for the properties and performance of nano- films.
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