MoS2/MX2/MoS2三层异质结构的电子性质:第一性原理研究

Kanak Datta, Q. Khosru
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引用次数: 7

摘要

在这项工作中,我们对MoS2/MX2/MoS2 (M=Mo或W;X=S或Se)三层异质结构。研究了叠层构型、双轴压缩应变和拉伸应变对三层异质结构电子性能的影响。在我们的研究中发现,在松弛条件下,不同堆叠构型的三层异质结构都表现出半导体性质。然而,带隙的性质取决于顶部和底部MoS2层之间插入的TMDC单层及其堆叠结构。与双层异质结构一样,在拉伸应变作用下,三层异质结构也表现出从半导体到金属的转变。随着拉伸应变的增大,导带极小值向布里渊区的K点移动,导带极小值处的电子有效质量降低。态的投影密度研究表明,导带的最小值主要由二硫化钼层贡献,价带的最大值由中间的TMDC单层贡献。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electronic Properties of MoS2/MX2/MoS2 Trilayer Heterostructures: A First Principle Study
In this work, we have presented a first principle simulation study on the electronic properties of MoS2/MX2/MoS2 (M=Mo or W; X=S or Se) trilayer heterostrcuture. We have investigated the effect of stacking configuration, bi-axial compressive and tensile strain on the electronic properties of the trilayer heterostructures. In our study, it is found that, under relaxed condition all the trilayer heterostructures at different stacking configurations show semiconducting nature. The nature of the bandgap however depends on the inserted TMDC monolayer between the top and bottom MoS2 layers and their stacking configurations. Like bilayer heterostructures, trilayer structures also show semiconducting to metal transition under the application of tensile strain. With increased tensile strain the conduction band minima shifts to K point in the brillouin zone and lowering of electron effective mass at conduction band minima is observed. The study on the projected density of states reveal that, the conduction band minima is mostly contributed by the MoS2 layers and states at the valance band maxima are contributed by the middle TMDC monolayer.
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