易感性的映射

S. Zaky, K. Balmain, G. Dubois
{"title":"易感性的映射","authors":"S. Zaky, K. Balmain, G. Dubois","doi":"10.1109/isemc.1992.626139","DOIUrl":null,"url":null,"abstract":"The concept of susceptibility mapping is introduced. A susceptibility map is created by scanning a signal source (loop antenna) over a circuit board, and at each point raising the signal level until failure occurs. Maps obtained with CW EM1 reveal design problems such as tight circuit timing or small static noise margins. They also reveal manufacturing problems, such as bad contacts and faulty chips. This leads to the concept of electromagnetic stress testing. Maps obtained with transient EM1 require tight synchronization for repeatability and are useful in studying specific software-dependent failures.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"439-442"},"PeriodicalIF":0.0000,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":"{\"title\":\"Susceptibility Mapping\",\"authors\":\"S. Zaky, K. Balmain, G. Dubois\",\"doi\":\"10.1109/isemc.1992.626139\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The concept of susceptibility mapping is introduced. A susceptibility map is created by scanning a signal source (loop antenna) over a circuit board, and at each point raising the signal level until failure occurs. Maps obtained with CW EM1 reveal design problems such as tight circuit timing or small static noise margins. They also reveal manufacturing problems, such as bad contacts and faulty chips. This leads to the concept of electromagnetic stress testing. Maps obtained with transient EM1 require tight synchronization for repeatability and are useful in studying specific software-dependent failures.\",\"PeriodicalId\":93568,\"journal\":{\"name\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"volume\":\"9 1\",\"pages\":\"439-442\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"21\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/isemc.1992.626139\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/isemc.1992.626139","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

摘要

本文章由计算机程序翻译,如有差异,请以英文原文为准。
Susceptibility Mapping
The concept of susceptibility mapping is introduced. A susceptibility map is created by scanning a signal source (loop antenna) over a circuit board, and at each point raising the signal level until failure occurs. Maps obtained with CW EM1 reveal design problems such as tight circuit timing or small static noise margins. They also reveal manufacturing problems, such as bad contacts and faulty chips. This leads to the concept of electromagnetic stress testing. Maps obtained with transient EM1 require tight synchronization for repeatability and are useful in studying specific software-dependent failures.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
CiteScore
0.30
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信