TeO2中禁止X射线反射测量中的多波效应处理

IF 1.5 4区材料科学 Q3 CRYSTALLOGRAPHY

Crystal Research and Technology Pub Date : 2021-03-22 DOI:10.1002/crat.202000195

K. Kozlovskaya, A. Kulikov, D. Novikov, E. Ovchinnikova, A. M. Ustyugov, V. Dmitrienko

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引用次数: 1

摘要

多波X射线反射通常会加剧Bragg反射的测量，特别是弱“禁止”反射。对多波峰的精确分析通常可以避免这种情况。然而，多波反射也可以提供晶体结构的信息，因为晶体单元的参数决定了多波峰的位置。本文测量了副卫星中的禁反射002和禁反射100，并给出了一种基于半运动学X射线散射的多波干涉处理方法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Handling of Multiple‐Wave Effects in the Measurement of Forbidden X‐Ray Reflections in TeO2

Multiple‐wave X‐ray reflections usually aggravate the measurement of Bragg reflections, especially of weak “forbidden” reflections. Accurate analysis of multiple‐wave peaks usually allows to avoid this. However, multiple‐wave reflections can also provide information about crystal structure, since crystal cell parameters determine the positions of multi‐wave peaks. The forbidden reflections 002 and 100 in paratellurite are measured and an approach based on semi‐kinematical X‐ray scattering used to handle the multiple‐wave interferences is shown here.

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来源期刊

Crystal Research and Technology 化学-晶体学

自引率

6.70%

发文量

121

审稿时长

1.9 months

期刊介绍： The journal Crystal Research and Technology is a pure online Journal (since 2012). Crystal Research and Technology is an international journal examining all aspects of research within experimental, industrial, and theoretical crystallography. The journal covers the relevant aspects of -crystal growth techniques and phenomena (including bulk growth, thin films) -modern crystalline materials (e.g. smart materials, nanocrystals, quasicrystals, liquid crystals) -industrial crystallisation -application of crystals in materials science, electronics, data storage, and optics -experimental, simulation and theoretical studies of the structural properties of crystals -crystallographic computing