载流子寿命测量的微波反射:灵敏度和瞬态响应的综合研究

Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC) Pub Date : 1994-12-05 DOI:10.1109/WCPEC.1994.520536

Martin Schdfthaler, Rolf Brendel

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引用次数: 2

摘要

时间分辨微波反射技术被广泛应用于光伏行业的过程控制。我们演示了如何用这种方法优化载波寿命测量的灵敏度和可靠性。我们的方法是基于一个介电多层模型，使我们能够计算脉冲激光激发后多余载流子衰变的微波反射瞬态。我们发现，只有当反射器的位置适当时，反射的微波功率才能反映载流子的衰减。

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Microwave reflections for carrier lifetime measurements: a comprehensive study on sensitivity and transient response

The time-resolved microwave reflection technique is widely used for process control in the photovoltaic community. We demonstrate how to optimize the sensitivity and the reliability of carrier lifetime measurements with this method. Our approach is based on a dielectric multilayer model that allows us to calculate microwave reflection transients from excess carrier decay after pulsed laser excitation. We find that the reflected microwave power mirrors the carrier decay only if the reflector is positioned appropriately.

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Proceedings of 1994 IEEE 1st World Conference on Photovoltaic Energy Conversion - WCPEC (A Joint Conference of PVSC, PVSEC and PSEC)

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