经导管封闭儿童室间隔缺损的长期随访及单孔与多孔室间隔缺损的比较

IF 0.4 4区 医学 Q4 PEDIATRICS
Hojjat Mortezaeian, M. Farshidgohar, A. Vesal, B. Alizadeh, Yasaman Khalili, M. Meraji, N. Haas
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引用次数: 0

摘要

背景:经导管室间隔缺损(VSD)闭合术后并发症的评估在长期随访和大样本儿童中是有限的。目的:比较单孔和多孔室间隔经导管关闭后的残留分流,这是一项目前尚未完成的新任务。方法:本回顾性研究包括2009年至2020年在三级心血管中心接受经导管装置闭合治疗室间隔缺损的所有患者。在术后1、6、12个月和每年使用经胸超声心动图(TTE)和心电图(ECG)进行随访评估。结果:409例患者行经导管室间隔闭合术。平均年龄为7岁(2 ~ 15岁),中位随访时间为48个月(1 ~ 10年)。单发VSD 259例(63.4%),多发出口孔150例(36.6%)。多孔分流器植入后立即残留分流器的发生率明显高于单孔分流器植入后立即残留分流器的发生率(P = 0.008)。随访期间,单孔vsd组的残余分流减少。新发轻度和中度三尖瓣反流(TR)分别为45例(11%)和16例(4%),随着时间的推移显著减少。仅有1例患者出现新发轻度主动脉反流(AR)。2例患者最关键的并发症是持续完全性心脏传导阻滞。结论:室间隔缺损伴多出口孔是残留分流的危险因素。经导管VSD关闭后,多孔VSD患者的残留分流率显著高于其他患者(P = 0.008)。虽然TR可能在手术过程中增加,但随着时间的推移,它会急剧下降。有趣的是,术前有三尖瓣或主动脉瓣反流的患者在手术2年后消失。最重要的并发症是2例完全性心脏传导阻滞。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Long-Term Follow-up of Transcatheter Ventricular Septal Defect Closure in Children, and Comparison of Single-Hole Versus Multi-holes Ventricular Septal Defects
Background: Evaluation of complications after transcatheter ventricular septal defect (VSD) closure in long-term follow-up and large samples of children is limited. Objectives: We compared the residual shunt after transcatheter closure in VSDs with a single hole and multiple holes, a new task that has not been done so far. Methods: This retrospective study included all patients who underwent transcatheter device closure for VSD in a tertiary cardiovascular center from 2009 to 2020. Follow-up evaluation using transthoracic echocardiography (TTE) and electrocardiogram (ECG) was performed at 1, 6, 12 months, and annually after the procedure. Results: A total of 409 patients underwent transcatheter VSD closure. The mean age was 7 years (2 - 15 years), and the median follow-up duration was 48 months (1 - 10 years). The number of patients with a singular VSD was 259 (63.4%), and those with multiple exit holes were 150 (36.6%). The incidence of a residual shunt immediately after implantation was significantly higher in VSDs with multiple holes than those with a single hole (P = 0.008). During the follow-up, the residual shunts decreased in the group of VSDs with a single hole. Forty-five patients (11%) and 16 patients (4%) had a new-onset of mild and moderate tricuspid regurgitation (TR), respectively, and it decreased dramatically over time. Only 1 patient showed a new-onset mild aortic regurgitation (AR). The most crucial complication shown in 2 patients was a persistent complete heart block. Conclusions: Ventricular septal defects with multiple exit holes are a risk factor for a residual shunt. After transcatheter VSD closure, the residual shunt in patients with a multiple-hole VSD was significantly higher (P = 0.008). Although TR may increase during the procedure, it decreases dramatically over time. Interestingly, patients who had pre-procedure tricuspid or aortic regurgitation disappeared after 2 years of the procedure. The most important complication was a complete heart block in 2 patients.
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来源期刊
CiteScore
0.90
自引率
20.00%
发文量
75
审稿时长
6-12 weeks
期刊介绍: Iranian Journal of Pediatrics (Iran J Pediatr) is a peer-reviewed medical publication. The purpose of Iran J Pediatr is to increase knowledge, stimulate research in all fields of Pediatrics, and promote better management of pediatric patients. To achieve the goals, the journal publishes basic, biomedical, and clinical investigations on prevalent diseases relevant to pediatrics. The acceptance criteria for all papers are the quality and originality of the research and their significance to our readership. Except where otherwise stated, manuscripts are peer-reviewed by minimum three anonymous reviewers. The Editorial Board reserves the right to refuse any material for publication and advises that authors should retain copies of submitted manuscripts and correspondence as the material cannot be returned. Final acceptance or rejection rests with the Editors.
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