WLCSP橡胶焊料(SOR)结构的设计、实验与分析

C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang
{"title":"WLCSP橡胶焊料(SOR)结构的设计、实验与分析","authors":"C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang","doi":"10.1109/ESIME.2006.1643969","DOIUrl":null,"url":null,"abstract":"A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed","PeriodicalId":60796,"journal":{"name":"微纳电子与智能制造","volume":"42 1","pages":"1-7"},"PeriodicalIF":0.0000,"publicationDate":"2006-04-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Design, Experiment and Analysis of the Solder on Rubber (SOR) structure of WLCSP\",\"authors\":\"C. Yuan, G.Q. Zhang, Ching-Shun Huang, Chun-Hui Yu, Chin-Cheng Yang, Wen-Kung Yang, M. Yew, Cheng-Nan Han, K. Chiang\",\"doi\":\"10.1109/ESIME.2006.1643969\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed\",\"PeriodicalId\":60796,\"journal\":{\"name\":\"微纳电子与智能制造\",\"volume\":\"42 1\",\"pages\":\"1-7\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2006-04-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"微纳电子与智能制造\",\"FirstCategoryId\":\"1087\",\"ListUrlMain\":\"https://doi.org/10.1109/ESIME.2006.1643969\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"微纳电子与智能制造","FirstCategoryId":"1087","ListUrlMain":"https://doi.org/10.1109/ESIME.2006.1643969","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

摘要

提出了一种新型的硅片级芯片级封装(WLCSP)的橡胶焊料(SOR)结构,该结构能够释放由硅片与衬底之间CTE不匹配引起的变形能。在SOR结构中,金属痕迹和焊盘将在橡胶基聚合物上形成,并且焊料附着在所述焊盘上。此外,在金属迹线与应力缓冲层(SBL)之间设计并制作了分层层,并将金属迹线设计为弯曲形状,以防止迹线的过度拉伸。通过设计的分层层的破坏,理论上SOR结构可以比传统的WLCSP结构释放更多的能量。本文讨论了SOR结构的设计理念、脱层粘接强度的实验测量以及SOR结构的有限元分析
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Design, Experiment and Analysis of the Solder on Rubber (SOR) structure of WLCSP
A novel solder on rubber (SOR) structure of the advanced wafer level chip scaled packaging (WLCSP), having the capability of releasing the deformation energy which is caused by the CTE mismatch between the silicon chip and the substrate, is proposed herein. In the SOR structure, a metallic trace and solder pad would be formed on the rubber-based polymer, and a solder is attached onto the said pad. Moreover, a delamination layer is designed and fabricated between the metallic trace and the stress buffer layer (SBL), and the metal trace is also designed as curved shape to prevent the over-stretching of the trace. By the failure of the designed delamination layer, the SOR structure could theoretically release more energy than the conventional WLCSP structure. In this paper, the design concept of the SOR structure, experimental measurement of the adhesion strength of the delamination layer and the finite element (FE) analysis of the SOR structure are discussed
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
145
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信