多小驱动器系统中直流电容寿命研究

电力电子 Pub Date : 2019-12-01 DOI:10.1109/COBEP/SPEC44138.2019.9065455

Shili Huang, Haoran Wang, D. Kumar, G. Zhu, Huai Wang

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引用次数: 0

摘要

本文研究了多小驱动器系统中DC-Link电容的可靠性问题。为了简单准确地获得单个驱动器中电容器的电热应力，提出了多小驱动器系统的时效等效模型及其解析模型。基于所提出的等效电路模型和现有的寿命预测方法，分析了多个超薄驱动器中驱动器编号对直流链路电容可靠性的影响。研究结果可从可靠性方面为多个超薄驱动器系统的电容尺寸设计提供指导。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Lifetime Investigation of DC-link Capacitors in Multiple Slim Drives System

This paper studies the reliability of DC-Link capacitor in multiple slim drives system. In order to obtain the electro-thermal stress of capacitor in individual drive simply and accurately, a time-efficient equivalent model and its analytical model for multiple slim drives system is proposed. Based on the proposed equivalent circuit model and the existing lifetime prediction method, the impact of drive numbers on the reliability of DC-link capacitor in multiple slim drives is analyzed. The results serve as a guideline for capacitor sizing in multiple slim drives system from reliability aspect.

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电力电子

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