基于横向肖特基势垒闸的A1GaN/GaN场效应晶体管作为毫米波探测器

P. Sai, D. But, K. Nowakowski-Szkudlarek, J. Przybytek, P. Prystawko, I. Yahniuk, P. Wiśniewski, B. Stonio, M. Słowikowski, S. Rumyantsev, W. Knap, G. Cywiński
{"title":"基于横向肖特基势垒闸的A1GaN/GaN场效应晶体管作为毫米波探测器","authors":"P. Sai, D. But, K. Nowakowski-Szkudlarek, J. Przybytek, P. Prystawko, I. Yahniuk, P. Wiśniewski, B. Stonio, M. Słowikowski, S. Rumyantsev, W. Knap, G. Cywiński","doi":"10.1109/IRMMW-THZ.2018.8510420","DOIUrl":null,"url":null,"abstract":"We report on comparison studies between a novel transistor like device and two dimensional Fin Field-Effect transistor towards their applications in a terahertz resonant detector. Both device structures have been fabricated on the same wafer of GaN/AIGaN epistructure during one processing run. The proposed here the transistor-like structure has two side Schottky gates, which can be biased towards complete pinch-off the 2DEG channel in this device. At certain conditions, near to pinch-off region, it is possible to obtain one dimensional current flow. This feature is especially attractive for THz resonant detector approach, which will be discussed in details.","PeriodicalId":6653,"journal":{"name":"2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","volume":"46 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A1GaN/GaN Field Effect Transistors Based on Lateral Schottky Barrier Gates as Millimeter Wave Detectors\",\"authors\":\"P. Sai, D. But, K. Nowakowski-Szkudlarek, J. Przybytek, P. Prystawko, I. Yahniuk, P. Wiśniewski, B. Stonio, M. Słowikowski, S. Rumyantsev, W. Knap, G. Cywiński\",\"doi\":\"10.1109/IRMMW-THZ.2018.8510420\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We report on comparison studies between a novel transistor like device and two dimensional Fin Field-Effect transistor towards their applications in a terahertz resonant detector. Both device structures have been fabricated on the same wafer of GaN/AIGaN epistructure during one processing run. The proposed here the transistor-like structure has two side Schottky gates, which can be biased towards complete pinch-off the 2DEG channel in this device. At certain conditions, near to pinch-off region, it is possible to obtain one dimensional current flow. This feature is especially attractive for THz resonant detector approach, which will be discussed in details.\",\"PeriodicalId\":6653,\"journal\":{\"name\":\"2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)\",\"volume\":\"46 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IRMMW-THZ.2018.8510420\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 43rd International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRMMW-THZ.2018.8510420","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文报道了一种新型类晶体管器件与二维翅片场效应晶体管在太赫兹谐振探测器中的应用比较研究。这两种器件结构都是在同一片GaN/AIGaN基础结构上制造的。这里提出的晶体管样结构具有两个侧肖特基门,可以偏向于完全掐断该器件中的2DEG通道。在一定条件下,在掐断区附近,可以得到一维电流。这一特点对太赫兹谐振探测器方法特别有吸引力,我们将详细讨论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A1GaN/GaN Field Effect Transistors Based on Lateral Schottky Barrier Gates as Millimeter Wave Detectors
We report on comparison studies between a novel transistor like device and two dimensional Fin Field-Effect transistor towards their applications in a terahertz resonant detector. Both device structures have been fabricated on the same wafer of GaN/AIGaN epistructure during one processing run. The proposed here the transistor-like structure has two side Schottky gates, which can be biased towards complete pinch-off the 2DEG channel in this device. At certain conditions, near to pinch-off region, it is possible to obtain one dimensional current flow. This feature is especially attractive for THz resonant detector approach, which will be discussed in details.
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