Multipactor threshold sensitivity to Total Electron Emission Yield in parallel-plate waveguide and TEEY models accuracy

Multipactor effect can lead to RF components deterioration which could be fatal to RF systems in space communication payloads or in experimental fusion devices. To avoid such risk, oversized margins are used. Multipactor simulations are used to get voltage threshold predictions. Since the power breakdown depends on the Total Electron Emission Yield (TEEY) curve a sensitivity study has been made to determine which parameters of the TEEY properties are critical. An evaluation of multipactor threshold sensitivity to TEEY curve variations is realized and two critical parameters are found for parallel-plate geometry: first cross-over energy and the curve definition for incident electron energy between the first cross-over and the maximum curve energies. Six TEEY models and their accuracy to predict voltage threshold are compared. Electron emission experimental measurements have to be accurate on the first cross-over energy and TEEY model must respect this value to obtain coherent multipactor voltage threshold.