几种温室栽培蔬菜叶面积的无损测定

Cihan Karaca, D. Büyüktaş, Süleyman Şehir
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引用次数: 1

摘要

使用数学模型方法,这是一种非破坏性的方法来确定叶面积,近年来已被安全使用。最重要的原因是应用简单,应用成本很低。该方法最大的缺点是导出的模型需要根据不同的作物品种进行校准。在研究中,首先将作物单叶的宽度(W)和长度(L)测量值与叶片的实际面积相关联,并建立了作物特异性模型。每片树叶的实际面积(LA)由ImageJ软件确定。在本研究中,针对不同的作物品种建立了7个不同的模型(1,LA=a+bL 2 +cL 2 /W 2 +dW 2 +eLW;2、LA=a+bL 2 +cW 2 +dLW;3、LA=a+bL 2 +cW 2;4、LA=aL 2 + bw2;5、LA=aL b +cW d +e;6日,洛杉矶= a + bLW;7日,洛杉矶= aLW)。模型中的系数是针对每种作物单独确定的。为了评价模型的性能,使用了决定系数(r2)、均方根误差(RMSE)、相对误差(RE)、平均偏倚误差(MBE)和Willmott指数(d)等性能标准。在本研究中,番茄叶面积估算精度较高(r2 =0.96;r2 =0.99(辣椒、茄子和黄瓜),无需使用昂贵的测量设备。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Determination of Leaf Area of Some Vegetable Plants Grown under Greenhouse Condition by Non-Destructive Methods
The use of a mathematical model approach, which is a non-destructive method to determine the leaf area, has been used safely in recent years. The most important reason for this is that the application is easy and the application cost is very low. The most important disadvantage of this method is that the derived models need calibration according to different crop varieties. In the study, firstly, the width (W) and length (L) measurements of each individual leaf taken from the crops were correlated with the actual area of the leaf and crop-specific models were developed. The actual area (LA) of each leaf used in the sampling was determined by the ImageJ software. In the study, 7 different models were derived for each crop species (1, LA=a+bL 2 +cL 2 /W 2 +dW 2 +eLW; 2, LA=a+bL 2 +cW 2 +dLW; 3, LA=a+bL 2 +cW 2 ; 4, LA=aL 2 +bW 2 ; 5, LA=aL b +cW d +e; 6, LA=a+bLW; 7, LA=aLW). The coefficients in the models were determined separately for each crop species. In order to evaluate the performance of the models, some performance criteria such as determination coefficient (R 2 ) and root mean square error (RMSE), relative error (RE), mean bias error (MBE) and Willmott index (d) were used. In this study, leaf areas were estimated with high accuracy (R 2 =0.96 for tomato; R 2 =0.99 for pepper, eggplant and cucumber) with these models without using expensive measuring devices.
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