{"title":"一种测量植物叶面积的新方法和仪器","authors":"Derong Zhang, Yong He","doi":"10.1109/ISKE.2010.5680761","DOIUrl":null,"url":null,"abstract":"A algorithm with minimum memory consumption for labeling connected components in a binary image is presented in this paper. Based on embedded system technology, the algorithm is used in calculating the area of leaves, the high resolution images for this feature is provided by cheap scanner. Using the algorithm, a corresponding image processing program is developed, and it is ported successfully in embedded Linux & QT platform. With higher precision and lower cost, a new portable measuring instrument is developed for leaf area measurement.","PeriodicalId":6417,"journal":{"name":"2010 IEEE International Conference on Intelligent Systems and Knowledge Engineering","volume":"1 1","pages":"601-604"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A new method and instrument for measurement of plant leaf area\",\"authors\":\"Derong Zhang, Yong He\",\"doi\":\"10.1109/ISKE.2010.5680761\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A algorithm with minimum memory consumption for labeling connected components in a binary image is presented in this paper. Based on embedded system technology, the algorithm is used in calculating the area of leaves, the high resolution images for this feature is provided by cheap scanner. Using the algorithm, a corresponding image processing program is developed, and it is ported successfully in embedded Linux & QT platform. With higher precision and lower cost, a new portable measuring instrument is developed for leaf area measurement.\",\"PeriodicalId\":6417,\"journal\":{\"name\":\"2010 IEEE International Conference on Intelligent Systems and Knowledge Engineering\",\"volume\":\"1 1\",\"pages\":\"601-604\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2010 IEEE International Conference on Intelligent Systems and Knowledge Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISKE.2010.5680761\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 IEEE International Conference on Intelligent Systems and Knowledge Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISKE.2010.5680761","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new method and instrument for measurement of plant leaf area
A algorithm with minimum memory consumption for labeling connected components in a binary image is presented in this paper. Based on embedded system technology, the algorithm is used in calculating the area of leaves, the high resolution images for this feature is provided by cheap scanner. Using the algorithm, a corresponding image processing program is developed, and it is ported successfully in embedded Linux & QT platform. With higher precision and lower cost, a new portable measuring instrument is developed for leaf area measurement.