量子计算中粒子光学系统的展望

V. A. Zhukov, M. M. Nesterov
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引用次数: 2

摘要

研究了利用离子光刻技术制作细节分辨率约为2nm的量子计算机元件的理论可能性。为此,对三种轴对称组合浸没透镜进行了从纯静电状态边缘到组合镜状态边缘的一系列工作状态的研究。推导了组合透镜的四个主要离子光学参数:焦距f、色差系数Cd、三阶球差系数Cs和组合透镜线圈的安匝数NI的简单解析近似。这些参数以无因次量函数的形式表示(公式见文中),其中为离子在光刻靶处的能量,W0为离子的初始能量。结果表明,在无磁场条件下(纯静电条件下),组合透镜的轴向像差(Cc和Cs)和焦距f最大。结果表明,在ττ为0时,参数Cc、Cs、f和NI作为数量τ的函数为:Cc~τ1/6, Cs~τ1/4, f~τ1/3, NI~τ(-1/2)。还表明,离子光刻图像(通过在无抗蚀剂状态下使用重离子)可以在帧3×3mm2中具有2*1012像素,分辨率为2nm。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Perspectives of particle-optical systems in quantum computing
There is investigated theoretical possibility to make quantum computer elements by means of Ion Lithography with resolution of details about 2 nm. The axisymmetrical combined immersion lenses of three types are investigated for this aim in a whole range of working regimes from the edge of pure electrostatic regime to the edge of combined mirror regime. Simple analytical approximations are derived for four main ion-optical parameters of combined lenses: focal length f, coefficient of chromatic aberration Cd, coefficient of spherical aberration of the third order Cs, and Amper-turns in the magnetic coil of combined lens NI. These parameters are expressed in form of functions of dimensionless quantity (formula available in paper) is the energy of ions at the lithographic target and W0 is the initial energy of ions. It is shown that axial aberrations of combined lenses (Cc and Cs) and focal length f have a maximum under absence of magnetic field (when lenses are pure electrostatic). It is shown that under ττ yeilds 0 parameters Cc, Cs, f and NI, as functions of quantity τ, take forms: Cc~τ1/6, Cs~τ1/4, f~τ1/3, NI~τ(-1/2). It is shown also that the Ion Lithographic image (by using heavy ions in non-resist regime) could have 2*1012 pixels under resoltuion 2nm in the frame 3×3mm2.
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