{"title":"差距:亚洲制造领域的考验挑战","authors":"Xinli Gu","doi":"10.1109/TEST.2011.6139195","DOIUrl":null,"url":null,"abstract":"Today, more and more electronic manufacturing is being done in Asia. Test, as one of the important functions of manufacturing, is critical to guarantee the product quality and as a monitor of the manufacturing process. Through presenting the gap between the test challenges the Asia companies are facing and the tools they have today, we hope give the ITC community an opportunity to better understand the needs of innovation for test technologies and tools. This panel invites speakers from companies in Asia to present their test challenges and current solutions. It covers both design for test challenges and the complexities of the production test challenges. The focus is on the gap between what they need with today's challenges and the current capabilities.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"243 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"The gap: Test challenges in Asia manufacturing field\",\"authors\":\"Xinli Gu\",\"doi\":\"10.1109/TEST.2011.6139195\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Today, more and more electronic manufacturing is being done in Asia. Test, as one of the important functions of manufacturing, is critical to guarantee the product quality and as a monitor of the manufacturing process. Through presenting the gap between the test challenges the Asia companies are facing and the tools they have today, we hope give the ITC community an opportunity to better understand the needs of innovation for test technologies and tools. This panel invites speakers from companies in Asia to present their test challenges and current solutions. It covers both design for test challenges and the complexities of the production test challenges. The focus is on the gap between what they need with today's challenges and the current capabilities.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"243 1\",\"pages\":\"1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2011.6139195\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2011.6139195","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The gap: Test challenges in Asia manufacturing field
Today, more and more electronic manufacturing is being done in Asia. Test, as one of the important functions of manufacturing, is critical to guarantee the product quality and as a monitor of the manufacturing process. Through presenting the gap between the test challenges the Asia companies are facing and the tools they have today, we hope give the ITC community an opportunity to better understand the needs of innovation for test technologies and tools. This panel invites speakers from companies in Asia to present their test challenges and current solutions. It covers both design for test challenges and the complexities of the production test challenges. The focus is on the gap between what they need with today's challenges and the current capabilities.