nd0.75 sm0.25高三单晶的拉曼光谱研究

R. Nithya, D. Daniel, T R Ravindran
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引用次数: 0

摘要

采用浮动区技术在四镜红外成像炉上生长了nd1 - xsmx高三(x= 0和0.25)单晶。通过x射线衍射和拉曼光谱测量对晶体进行了表征。NGO采用Pbnm对称的正交结构,钐取代物也表现出与未含二次相的原始化合物相同的结构。偏振拉曼光谱是在环境温度下以背散射几何形状测量的。光谱表现为低强度的一阶拉曼波段。此外,在2000 ~ 4000 cm−1的频率范围内,还观察到几个高强度的二阶拉曼波段。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Raman spectroscopic studies of Nd0.75Sm0.25GaO3 single crystals
Single crystals of Nd1-xSmxGaO3 (x= 0 and 0.25) were grown by a four mirror IR image furnace using floating zone technique. The crystals are characterized by X-ray diffraction and Raman spectroscopic measurements. NGO adopts orthorhombic structure with Pbnm symmetry and samarium substituted compound also exhibited the same structure as that of the pristine compound without secondary phases. Polarized Raman spectra are measured at ambient temperature in a back scattering geometry. Spectra exhibit low intensity first-order Raman bands. In addition, several high intensity second-order Raman bands have been observed in the frequency range 2000 to 4000 cm−1.
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