FOUP清洗的动态调度

Binay Dash, K. Iyer, J. Barker, Shiladitya Chakravorty
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引用次数: 0

摘要

在半导体制造工厂(FAB)中,晶圆的大部分制造寿命都是在前开口统一吊舱(foup)中度过的,因此环境必须与制造车间一样干净,甚至更干净。虽然制造设备通常被构造为主动净化和交换内部环境到晶圆厂气氛,但FOUP是一个相对静态的环境,只能将其环境与周围存储区域平衡。因此,为了确保生产的晶圆符合要求的质量,定期清洗foup是必不可少的。然而,清洗foup数量的选择对在制品流策略、调度和调度决策提出了挑战。在这张海报中,我们将介绍FOUP清洗,计量和调度挑战的通用选项。随后,我们将讨论考虑和采用的各种策略,以在调度方面的各种因素之间实现适当的权衡。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Dynamic Dispatching for FOUP Cleaning
In a semiconductor manufacturing facility (FAB), wafers spend the majority of their manufacturing life in Front Opening Unified Pods (FOUPs), and it is essential that the environment be as clean as, or cleaner than, that of the manufacturing floor. While manufacturing equipment are usually constructed to actively purge and exchange internal environment to fab atmosphere, the FOUP is a relatively static environment that can only equalize its environment with the ambient area of storage. Hence periodic cleaning of FOUPs is essential to ensure the wafers produced meet requisite quality. However, selection of the number of FOUPs for cleaning provides challenges to the WIP flow strategy, scheduling and dispatching decisions. In this poster, we will cover the generic options for FOUP cleaning, metrology and dispatching challenges. Subsequently we will discuss the various strategies considered and employed to achieve appropriate trade-offs between various factors with respect to dispatching.
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