{"title":"行业领袖座谈——测试在未来10年会发生怎样的变化?","authors":"P. Nigh","doi":"10.1109/TEST.2011.6139192","DOIUrl":null,"url":null,"abstract":"Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.","PeriodicalId":6403,"journal":{"name":"2007 IEEE International Test Conference","volume":"57 1","pages":"1"},"PeriodicalIF":0.0000,"publicationDate":"2011-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Industry leaders panel - How will testing change in the next 10 years?\",\"authors\":\"P. Nigh\",\"doi\":\"10.1109/TEST.2011.6139192\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.\",\"PeriodicalId\":6403,\"journal\":{\"name\":\"2007 IEEE International Test Conference\",\"volume\":\"57 1\",\"pages\":\"1\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2007 IEEE International Test Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TEST.2011.6139192\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2011.6139192","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Industry leaders panel - How will testing change in the next 10 years?
Summary Industry test experts will provide their views on how the test is going to change in the next 10 years. Topics will cover the future of Test Equipment, Design-for-Test, EDA software, Foundry Test Support and Test Methods. This panel will describe fundamental changes in the test field and the long-term impacts of these changes. Panelists will also describe how these trends are driving emerging business opportunities. The panelists will make provocative predictions in a way that is never seen in formal papers or presentations.
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