Mengzhi Wang, Kinman Au, A. Ailamaki, A. Brockwell, C. Faloutsos, G. Ganger
{"title":"基于CART模型的存储设备性能预测","authors":"Mengzhi Wang, Kinman Au, A. Ailamaki, A. Brockwell, C. Faloutsos, G. Ganger","doi":"10.1145/1005686.1005743","DOIUrl":null,"url":null,"abstract":"Storage device performance prediction is a key element of self-managed storage systems. The paper explores the application of a machine learning tool, CART (classification and regression trees) models, to storage device modeling. Our approach predicts a device's performance as a function of input workloads, requiring no knowledge of the device internals. We propose two uses of CART models: one that predicts per-request response times (and then derives aggregate values); one that predicts aggregate values directly from workload characteristics. After being trained on the device in question, both provide accurate black-box models across a range of test traces from real environments. Experiments show that these models predict the average and 90th percentile response time with a relative error as low as 19%, when the training workloads are similar to the testing workloads, and interpolate well across different workloads.","PeriodicalId":32394,"journal":{"name":"Performance","volume":"33 1","pages":"588-595"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"175","resultStr":"{\"title\":\"Storage device performance prediction with CART models\",\"authors\":\"Mengzhi Wang, Kinman Au, A. Ailamaki, A. Brockwell, C. Faloutsos, G. Ganger\",\"doi\":\"10.1145/1005686.1005743\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Storage device performance prediction is a key element of self-managed storage systems. The paper explores the application of a machine learning tool, CART (classification and regression trees) models, to storage device modeling. Our approach predicts a device's performance as a function of input workloads, requiring no knowledge of the device internals. We propose two uses of CART models: one that predicts per-request response times (and then derives aggregate values); one that predicts aggregate values directly from workload characteristics. After being trained on the device in question, both provide accurate black-box models across a range of test traces from real environments. Experiments show that these models predict the average and 90th percentile response time with a relative error as low as 19%, when the training workloads are similar to the testing workloads, and interpolate well across different workloads.\",\"PeriodicalId\":32394,\"journal\":{\"name\":\"Performance\",\"volume\":\"33 1\",\"pages\":\"588-595\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"175\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Performance\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1005686.1005743\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Performance","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1005686.1005743","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Storage device performance prediction with CART models
Storage device performance prediction is a key element of self-managed storage systems. The paper explores the application of a machine learning tool, CART (classification and regression trees) models, to storage device modeling. Our approach predicts a device's performance as a function of input workloads, requiring no knowledge of the device internals. We propose two uses of CART models: one that predicts per-request response times (and then derives aggregate values); one that predicts aggregate values directly from workload characteristics. After being trained on the device in question, both provide accurate black-box models across a range of test traces from real environments. Experiments show that these models predict the average and 90th percentile response time with a relative error as low as 19%, when the training workloads are similar to the testing workloads, and interpolate well across different workloads.