A. Ślebarski, M. Maple, E. J. Freeman, C. Sirvent, M. Radłowska, A. Jezierski, E. Granado, Q. Huang, J. W. Lynn
{"title":"复合CeRhSn中的强相关电子行为","authors":"A. Ślebarski, M. Maple, E. J. Freeman, C. Sirvent, M. Radłowska, A. Jezierski, E. Granado, Q. Huang, J. W. Lynn","doi":"10.1080/13642810208218354","DOIUrl":null,"url":null,"abstract":"Abstract Electrical resistivity ρ, magnetic susceptibility χ, specific heat C, X-ray photoelectron spectroscopy (XPS) and X-ray and neutron diffraction measurements were made on the compound CeRhSn. The measurements reveal an enhancement of the electronic specific heat coefficient γ = C(T)/T ≈ 160 mJ mol−1 K−2 at about 1 K and non-Fermi-liquid-like temperature dependences ρ(T) α T 0.75 and χ(T) α T −0.5 at low temperatures. At high temperatures, the physical properties indicate Kondo-intermediate-valence behaviour. The XPS measurements are consistent with a Ce valence of 3.07. The neutron diffraction measurements reveal anomalies in the planar Ce-Rh and Ce-Ce bond distances in the vicinity of 100 K which are apparently associated with the Ce valence instability in CeRhSn.","PeriodicalId":20016,"journal":{"name":"Philosophical Magazine Part B","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2002-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"Strongly correlated electron behaviour in the compound CeRhSn\",\"authors\":\"A. Ślebarski, M. Maple, E. J. Freeman, C. Sirvent, M. Radłowska, A. Jezierski, E. Granado, Q. Huang, J. W. Lynn\",\"doi\":\"10.1080/13642810208218354\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstract Electrical resistivity ρ, magnetic susceptibility χ, specific heat C, X-ray photoelectron spectroscopy (XPS) and X-ray and neutron diffraction measurements were made on the compound CeRhSn. The measurements reveal an enhancement of the electronic specific heat coefficient γ = C(T)/T ≈ 160 mJ mol−1 K−2 at about 1 K and non-Fermi-liquid-like temperature dependences ρ(T) α T 0.75 and χ(T) α T −0.5 at low temperatures. At high temperatures, the physical properties indicate Kondo-intermediate-valence behaviour. The XPS measurements are consistent with a Ce valence of 3.07. The neutron diffraction measurements reveal anomalies in the planar Ce-Rh and Ce-Ce bond distances in the vicinity of 100 K which are apparently associated with the Ce valence instability in CeRhSn.\",\"PeriodicalId\":20016,\"journal\":{\"name\":\"Philosophical Magazine Part B\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Philosophical Magazine Part B\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1080/13642810208218354\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Philosophical Magazine Part B","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/13642810208218354","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Strongly correlated electron behaviour in the compound CeRhSn
Abstract Electrical resistivity ρ, magnetic susceptibility χ, specific heat C, X-ray photoelectron spectroscopy (XPS) and X-ray and neutron diffraction measurements were made on the compound CeRhSn. The measurements reveal an enhancement of the electronic specific heat coefficient γ = C(T)/T ≈ 160 mJ mol−1 K−2 at about 1 K and non-Fermi-liquid-like temperature dependences ρ(T) α T 0.75 and χ(T) α T −0.5 at low temperatures. At high temperatures, the physical properties indicate Kondo-intermediate-valence behaviour. The XPS measurements are consistent with a Ce valence of 3.07. The neutron diffraction measurements reveal anomalies in the planar Ce-Rh and Ce-Ce bond distances in the vicinity of 100 K which are apparently associated with the Ce valence instability in CeRhSn.