一种软误差强化过程便携式嵌入式微处理器

V. Vashishtha, L. Clark, S. Chellappa, Anudeep R. Gogulamudi, A. Gujja, Chad Farnsworth
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引用次数: 4

摘要

提出了一种具有高软容错性的嵌入式微处理器内核。该设计通过建筑、微建筑和电路技术实现了硬度。这台机器的基础是一个双冗余的推测管道,它可以在它们进入架构状态时检测不匹配。增加的指令允许软件控制的恢复和重新启动心烦意乱的指令。关键架构状态以三模式冗余、自校正逻辑存储。特殊的自动化地点和路线流对多节点收费具有鲁棒性。全时钟门控允许低功耗,而冗余时钟减轻时钟干扰引起的错误。基于寄存器文件的缓存允许接近阈值的低电压操作。该设计是在商用90纳米体CMOS工艺上实现的。给出了硅的结果,包括误差修正的例子。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
A soft-error hardened process portable embedded microprocessor
An embedded microprocessor core designed to have high soft-error immunity is presented. The design achieves hardness via architectural, micro-architectural, and circuit techniques. The basis of the machine is a dual-redundant speculative pipeline that detects mismatches at their commission to architectural state. Added instructions allow software controlled recovery and restart of upset instructions. Key architectural state is stored in triple-mode redundant, self-correcting logic. Special automated place and route flows afford robustness against multiple node charge collection. Full clock gating allows low power, while redundant clocks mitigate clock upset induced errors. Register file based caches allow near-threshold low voltage operation. The design is implemented on a commercial 90-nm bulk CMOS process. Silicon results, including error correction examples, are presented.
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