{"title":"双栅p-n-i-n隧道场效应晶体管的紧凑建模","authors":"Wan-Jin Xu, H. Wong, H. Iwai","doi":"10.1109/TENCON.2015.7372924","DOIUrl":null,"url":null,"abstract":"An analytical model on the potential distribution and drain current characteristics for double gate p-n-i-n tunnel field-effect- transistor (TFET) is developed. In this model, the effect of channel inversion charge was taken into account and potential distribution was approximated by dividing the source, drain and channel regions into several parts so as to facilitate the analytical solution to the Poisson's equation near the tunneling junction. Then generation rate and total tunneling current are obtained using the Kane's model. This model is verified by comparing the results with TCAD simulation and good agreement is obtained.","PeriodicalId":22200,"journal":{"name":"TENCON 2015 - 2015 IEEE Region 10 Conference","volume":"77 1","pages":"1-2"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"On the compact modeling of double gate p-n-i-n tunneling field-effect transistors\",\"authors\":\"Wan-Jin Xu, H. Wong, H. Iwai\",\"doi\":\"10.1109/TENCON.2015.7372924\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An analytical model on the potential distribution and drain current characteristics for double gate p-n-i-n tunnel field-effect- transistor (TFET) is developed. In this model, the effect of channel inversion charge was taken into account and potential distribution was approximated by dividing the source, drain and channel regions into several parts so as to facilitate the analytical solution to the Poisson's equation near the tunneling junction. Then generation rate and total tunneling current are obtained using the Kane's model. This model is verified by comparing the results with TCAD simulation and good agreement is obtained.\",\"PeriodicalId\":22200,\"journal\":{\"name\":\"TENCON 2015 - 2015 IEEE Region 10 Conference\",\"volume\":\"77 1\",\"pages\":\"1-2\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2015-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"TENCON 2015 - 2015 IEEE Region 10 Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/TENCON.2015.7372924\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"TENCON 2015 - 2015 IEEE Region 10 Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TENCON.2015.7372924","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
On the compact modeling of double gate p-n-i-n tunneling field-effect transistors
An analytical model on the potential distribution and drain current characteristics for double gate p-n-i-n tunnel field-effect- transistor (TFET) is developed. In this model, the effect of channel inversion charge was taken into account and potential distribution was approximated by dividing the source, drain and channel regions into several parts so as to facilitate the analytical solution to the Poisson's equation near the tunneling junction. Then generation rate and total tunneling current are obtained using the Kane's model. This model is verified by comparing the results with TCAD simulation and good agreement is obtained.