用直接同步法产生时间分辨电子衍射的亚100fs电子脉冲。

K. Takubo, S. Banu, Sichen Jin, Misaki Kaneko, Wataru Yajima, M. Kuwahara, Yasuhiko Hayashi, T. Ishikawa, Y. Okimoto, M. Hada, S. Koshihara
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引用次数: 4

摘要

为了研究各种材料和分子中的光致现象,需要具有高亮度和高重复率的超短脉冲x射线和电子源。x射线和电子的典型波长和德布罗意波长比材料和分子的晶格常数短。因此,利用这些脉冲可以直接以衍射方式观察飞秒到皮秒时间尺度上的光致结构动力学。本研究创建了一个桌面超短脉冲电子衍射装置,该装置使用飞秒激光和电子脉冲压缩腔,直接同步到微波主振荡器(~ 3 GHz)。重复频率为1khz的压缩电子脉冲包含22.8万个电子。通过在超薄硅膜(50 nm)上进行光致即时晶格变化,估计样品位置的电子脉冲持续时间小于100 fs。新开发的时间分辨电子衍射装置具有与飞秒激光脉冲宽度(35-100 fs)相当的脉冲持续时间。特别是脉冲持续时间,符合量子材料中光致现象的时间尺度。我们开发的时间分辨率低于100秒的超快时间分辨电子衍射装置将成为材料科学中一个强大的工具,它结合了光泵浦探针、时间分辨光发射光谱和脉冲x射线测量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Generation of sub-100 fs electron pulses for time-resolved electron diffraction using a direct synchronization method.
To investigate photoinduced phenomena in various materials and molecules, ultrashort pulsed x-ray and electron sources with high brightness and high repetition rates are required. The x-ray and electron's typical and de Broglie wavelengths are shorter than lattice constants of materials and molecules. Therefore, photoinduced structural dynamics on the femtosecond to picosecond timescales can be directly observed in a diffraction manner by using these pulses. This research created a tabletop ultrashort pulsed electron diffraction setup that used a femtosecond laser and electron pulse compression cavity that was directly synchronized to the microwave master oscillator (∼3 GHz). A compressed electron pulse with a 1 kHz repetition rate contained 228 000 electrons. The electron pulse duration was estimated to be less than 100 fs at the sample position by using photoinduced immediate lattice changes in an ultrathin silicon film (50 nm). The newly developed time-resolved electron diffraction setup has a pulse duration that is comparable to femtosecond laser pulse widths (35-100 fs). The pulse duration, in particular, fits within the timescale of photoinduced phenomena in quantum materials. Our developed ultrafast time-resolved electron diffraction setup with a sub-100 fs temporal resolution would be a powerful tool in material science with a combination of optical pump-probe, time-resolved photoemission spectroscopic, and pulsed x-ray measurements.
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