从电路体系结构的角度分析计算系统的安全性

S. Taheri, Jiann-Shiun Yuan
{"title":"从电路体系结构的角度分析计算系统的安全性","authors":"S. Taheri, Jiann-Shiun Yuan","doi":"10.1109/DESEC.2017.8073843","DOIUrl":null,"url":null,"abstract":"Security and energy are considered as the most important parameters for designing and building an emerging computing system. Today's attacks target different layers of the computing system in both software- and hardware-level. On the other side, introduction of new transistor and memory technologies to the integrated circuits design is beneficial, especially for low energy requirements. However, they might bring new security vulnerabilities as well. Due to these issues, development of novel testing and security checking techniques is obligatory. In this regard, we study two attacks on a computing system within the domain of emerging transistor and memory technologies. A built-in-self-test architecture for testing and security checking an emerging memory is presented. At last, a defense technique is proposed that can identify and detect any abnormal behavior shown from the integrated circuits within the computing system using their current signals.","PeriodicalId":92346,"journal":{"name":"DASC-PICom-DataCom-CyberSciTech 2017 : 2017 IEEE 15th International Conference on Dependable, Autonomic and Secure Computing ; 2017 IEEE 15th International Conference on Pervasive Intelligence and Computing ; 2017 IEEE 3rd International...","volume":"1 1","pages":"166-173"},"PeriodicalIF":0.0000,"publicationDate":"2017-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Security analysis of computing systems from circuit-architectural perspective\",\"authors\":\"S. Taheri, Jiann-Shiun Yuan\",\"doi\":\"10.1109/DESEC.2017.8073843\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Security and energy are considered as the most important parameters for designing and building an emerging computing system. Today's attacks target different layers of the computing system in both software- and hardware-level. On the other side, introduction of new transistor and memory technologies to the integrated circuits design is beneficial, especially for low energy requirements. However, they might bring new security vulnerabilities as well. Due to these issues, development of novel testing and security checking techniques is obligatory. In this regard, we study two attacks on a computing system within the domain of emerging transistor and memory technologies. A built-in-self-test architecture for testing and security checking an emerging memory is presented. At last, a defense technique is proposed that can identify and detect any abnormal behavior shown from the integrated circuits within the computing system using their current signals.\",\"PeriodicalId\":92346,\"journal\":{\"name\":\"DASC-PICom-DataCom-CyberSciTech 2017 : 2017 IEEE 15th International Conference on Dependable, Autonomic and Secure Computing ; 2017 IEEE 15th International Conference on Pervasive Intelligence and Computing ; 2017 IEEE 3rd International...\",\"volume\":\"1 1\",\"pages\":\"166-173\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-08-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"DASC-PICom-DataCom-CyberSciTech 2017 : 2017 IEEE 15th International Conference on Dependable, Autonomic and Secure Computing ; 2017 IEEE 15th International Conference on Pervasive Intelligence and Computing ; 2017 IEEE 3rd International...\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/DESEC.2017.8073843\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"DASC-PICom-DataCom-CyberSciTech 2017 : 2017 IEEE 15th International Conference on Dependable, Autonomic and Secure Computing ; 2017 IEEE 15th International Conference on Pervasive Intelligence and Computing ; 2017 IEEE 3rd International...","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DESEC.2017.8073843","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

安全性和能源被认为是设计和构建新兴计算系统最重要的参数。今天的攻击目标是计算系统的不同层,包括软件层和硬件层。另一方面,在集成电路设计中引入新的晶体管和存储器技术是有益的,特别是在低能量要求的情况下。然而,它们也可能带来新的安全漏洞。由于这些问题,必须开发新的测试和安全检查技术。在这方面,我们研究了在新兴晶体管和存储器技术领域对计算系统的两种攻击。提出了一种用于新存储器测试和安全检查的内置自检体系结构。最后,提出了一种利用计算系统内集成电路的电流信号识别和检测其异常行为的防御技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Security analysis of computing systems from circuit-architectural perspective
Security and energy are considered as the most important parameters for designing and building an emerging computing system. Today's attacks target different layers of the computing system in both software- and hardware-level. On the other side, introduction of new transistor and memory technologies to the integrated circuits design is beneficial, especially for low energy requirements. However, they might bring new security vulnerabilities as well. Due to these issues, development of novel testing and security checking techniques is obligatory. In this regard, we study two attacks on a computing system within the domain of emerging transistor and memory technologies. A built-in-self-test architecture for testing and security checking an emerging memory is presented. At last, a defense technique is proposed that can identify and detect any abnormal behavior shown from the integrated circuits within the computing system using their current signals.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信