模拟集成电路的L/sup 2/ rfm -局部布局实际故障映射方案

M.J. Ohletz
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引用次数: 9

摘要

介绍了一种新的模拟集成电路故障建模方法——局部布局真实故障映射。它的目标是在最终布局之前进行实际的故障假设。假设缺陷,并评估其电气失效模式。结果表明,一些图解层面的断层是不现实的,出现了新的断层类型,断层的分布也发生了变化。对于CMOS运算放大器,故障数量从45个下降到27个。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
L/sup 2/RFM-local layout realistic faults mapping scheme for analogue integrated circuits
A new fault modelling scheme for analogue ICs called Local Layout Realistic Fault Mapping is introduced. It is aimed at realistic fault assumptions prior to the final layout. Defects are assumed and their electrical failure modes are evaluated. It turned out that some faults at schematic level are unrealistic, new types of fault emerge and the distribution of faults changes. For a CMOS operational amplifier the number of faults dropped from 45 to 27.
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CiteScore
3.80
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