{"title":"一般去嵌入目的的TRL校准程序的分析考虑","authors":"U. Schumann, A. Jöstingmeier, A. Omar","doi":"10.1109/ISSE.2019.8810268","DOIUrl":null,"url":null,"abstract":"In this paper, the suitability of the TRL calibration procedure as a technique for general de-embedding, i.e. in measurements and simulations, is examined. For the confirmation of the portability, simple test structures are examined purely analytically. Due to the character of this investigation, the behavior of the overall structure and the substructures is completely known and its applicability to general problems can be demonstrated.","PeriodicalId":6674,"journal":{"name":"2019 42nd International Spring Seminar on Electronics Technology (ISSE)","volume":"42 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2019-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Analytical Considerations of the TRL Calibration Procedure for General De-Embedding Purposes\",\"authors\":\"U. Schumann, A. Jöstingmeier, A. Omar\",\"doi\":\"10.1109/ISSE.2019.8810268\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, the suitability of the TRL calibration procedure as a technique for general de-embedding, i.e. in measurements and simulations, is examined. For the confirmation of the portability, simple test structures are examined purely analytically. Due to the character of this investigation, the behavior of the overall structure and the substructures is completely known and its applicability to general problems can be demonstrated.\",\"PeriodicalId\":6674,\"journal\":{\"name\":\"2019 42nd International Spring Seminar on Electronics Technology (ISSE)\",\"volume\":\"42 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-05-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 42nd International Spring Seminar on Electronics Technology (ISSE)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSE.2019.8810268\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 42nd International Spring Seminar on Electronics Technology (ISSE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSE.2019.8810268","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analytical Considerations of the TRL Calibration Procedure for General De-Embedding Purposes
In this paper, the suitability of the TRL calibration procedure as a technique for general de-embedding, i.e. in measurements and simulations, is examined. For the confirmation of the portability, simple test structures are examined purely analytically. Due to the character of this investigation, the behavior of the overall structure and the substructures is completely known and its applicability to general problems can be demonstrated.
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