基于fpga的可变松弛实时系统的修复

Leonardo P. Santos, G. Nazar, L. Carro
{"title":"基于fpga的可变松弛实时系统的修复","authors":"Leonardo P. Santos, G. Nazar, L. Carro","doi":"10.1145/3144533","DOIUrl":null,"url":null,"abstract":"Field-programmable gate arrays (FPGAs) based on SRAM cells are an attractive alternative for real-time system designers, as they offer high density, low cost, and high performance. The use of SRAM cells in the FPGA’s configuration memory, while enabling these desirable characteristics, also creates a reliability hazard as RAM cells are susceptible to single-event upsets (SEUs). The usual approach is the use of double or triple redundancy allied with a correction mechanism, such as periodic scrubbing. Although scrubbing is an effective technique to remove SEU-induced errors, the repair of real-time systems presents specific challenges, such as avoiding failures by missing real-time deadlines. In this article, a novel approach is proposed to use a deadline-aware scrubbing scheme with negligible area costs that dynamically chooses the scrubbing starting position. Such a scheme allows us to avoid missing real-time deadlines while maximizing the repair probability given a bounded repair time. Our approach reduces the failure rate, considering the probability of missing deadlines due to faults, by 33.39% on average, with an average area cost of 1.23%.","PeriodicalId":7063,"journal":{"name":"ACM Trans. Design Autom. Electr. Syst.","volume":"25 1","pages":"19:1-19:20"},"PeriodicalIF":0.0000,"publicationDate":"2018-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Repair of FPGA-Based Real-Time Systems With Variable Slacks\",\"authors\":\"Leonardo P. Santos, G. Nazar, L. Carro\",\"doi\":\"10.1145/3144533\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Field-programmable gate arrays (FPGAs) based on SRAM cells are an attractive alternative for real-time system designers, as they offer high density, low cost, and high performance. The use of SRAM cells in the FPGA’s configuration memory, while enabling these desirable characteristics, also creates a reliability hazard as RAM cells are susceptible to single-event upsets (SEUs). The usual approach is the use of double or triple redundancy allied with a correction mechanism, such as periodic scrubbing. Although scrubbing is an effective technique to remove SEU-induced errors, the repair of real-time systems presents specific challenges, such as avoiding failures by missing real-time deadlines. In this article, a novel approach is proposed to use a deadline-aware scrubbing scheme with negligible area costs that dynamically chooses the scrubbing starting position. Such a scheme allows us to avoid missing real-time deadlines while maximizing the repair probability given a bounded repair time. Our approach reduces the failure rate, considering the probability of missing deadlines due to faults, by 33.39% on average, with an average area cost of 1.23%.\",\"PeriodicalId\":7063,\"journal\":{\"name\":\"ACM Trans. Design Autom. Electr. Syst.\",\"volume\":\"25 1\",\"pages\":\"19:1-19:20\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-01-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"ACM Trans. Design Autom. Electr. Syst.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3144533\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACM Trans. Design Autom. Electr. Syst.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3144533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

摘要

基于SRAM单元的现场可编程门阵列(fpga)是实时系统设计人员的一个有吸引力的替代方案,因为它们具有高密度、低成本和高性能。在FPGA的配置存储器中使用SRAM单元,虽然可以实现这些理想的特性,但也会产生可靠性风险,因为RAM单元容易受到单事件干扰(seu)的影响。通常的方法是使用双重或三重冗余,并结合校正机制,如定期擦洗。虽然清洗是一种有效的技术,可以消除由seu引起的错误,但实时系统的修复存在一些特殊的挑战,例如避免错过实时截止日期而发生故障。在本文中,提出了一种新的方法,使用可忽略面积成本的截止日期感知擦洗方案,动态选择擦洗的起始位置。这样的方案可以避免错过实时截止日期,同时在给定有限的修复时间内最大化修复概率。考虑到由于故障而错过截止日期的概率,我们的方法将故障率平均降低了33.39%,平均面积成本为1.23%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Repair of FPGA-Based Real-Time Systems With Variable Slacks
Field-programmable gate arrays (FPGAs) based on SRAM cells are an attractive alternative for real-time system designers, as they offer high density, low cost, and high performance. The use of SRAM cells in the FPGA’s configuration memory, while enabling these desirable characteristics, also creates a reliability hazard as RAM cells are susceptible to single-event upsets (SEUs). The usual approach is the use of double or triple redundancy allied with a correction mechanism, such as periodic scrubbing. Although scrubbing is an effective technique to remove SEU-induced errors, the repair of real-time systems presents specific challenges, such as avoiding failures by missing real-time deadlines. In this article, a novel approach is proposed to use a deadline-aware scrubbing scheme with negligible area costs that dynamically chooses the scrubbing starting position. Such a scheme allows us to avoid missing real-time deadlines while maximizing the repair probability given a bounded repair time. Our approach reduces the failure rate, considering the probability of missing deadlines due to faults, by 33.39% on average, with an average area cost of 1.23%.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信