失效模式和影响分析(FMEA)在半导体制造中的系统维护和应用

Hongtao H. T. Qian, Z. Liu, Yuhong Betsy Xu
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引用次数: 3

摘要

失效模式与影响分析(FMEA)被认为是半导体制造中一种系统的、可学习的保留工具。本文首次尝试建立FMEA有效性的量化评价方法,并提出了FMEA在铸造厂(FAB)的系统化维护方法,以取代传统的纸质工作,实现智能维护,提高FMEA的及时性和准确性。并介绍了e-FMEA系统与其他FAB制造和监控系统的跨系统应用,以证明系统化后的有效性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Systematic maintenance and applications of Failure Modes and Effects Analysis (FMEA) in semiconductor manufacturing
Failure Modes and Effects Analysis (FMEA) is considered as a systematic, learning retention vehicle in semiconductor manufacturing. This paper tries to set up a quantized evaluation approach on FMEA effectiveness for the first time and also presents a systematic maintenance method of FMEA in Foundry (FAB) to instead of traditional paper works which realizes intelligent maintenance to increase the timeliness and accuracy of FMEA. And, cross system applications between e-FMEA system and other FAB manufacture and monitor systems are presented to show the effectiveness improve after systematization.
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