{"title":"失效模式和影响分析(FMEA)在半导体制造中的系统维护和应用","authors":"Hongtao H. T. Qian, Z. Liu, Yuhong Betsy Xu","doi":"10.1109/CSTIC.2017.7919853","DOIUrl":null,"url":null,"abstract":"Failure Modes and Effects Analysis (FMEA) is considered as a systematic, learning retention vehicle in semiconductor manufacturing. This paper tries to set up a quantized evaluation approach on FMEA effectiveness for the first time and also presents a systematic maintenance method of FMEA in Foundry (FAB) to instead of traditional paper works which realizes intelligent maintenance to increase the timeliness and accuracy of FMEA. And, cross system applications between e-FMEA system and other FAB manufacture and monitor systems are presented to show the effectiveness improve after systematization.","PeriodicalId":6846,"journal":{"name":"2017 China Semiconductor Technology International Conference (CSTIC)","volume":"19 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Systematic maintenance and applications of Failure Modes and Effects Analysis (FMEA) in semiconductor manufacturing\",\"authors\":\"Hongtao H. T. Qian, Z. Liu, Yuhong Betsy Xu\",\"doi\":\"10.1109/CSTIC.2017.7919853\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Failure Modes and Effects Analysis (FMEA) is considered as a systematic, learning retention vehicle in semiconductor manufacturing. This paper tries to set up a quantized evaluation approach on FMEA effectiveness for the first time and also presents a systematic maintenance method of FMEA in Foundry (FAB) to instead of traditional paper works which realizes intelligent maintenance to increase the timeliness and accuracy of FMEA. And, cross system applications between e-FMEA system and other FAB manufacture and monitor systems are presented to show the effectiveness improve after systematization.\",\"PeriodicalId\":6846,\"journal\":{\"name\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"volume\":\"19 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 China Semiconductor Technology International Conference (CSTIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CSTIC.2017.7919853\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 China Semiconductor Technology International Conference (CSTIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CSTIC.2017.7919853","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Systematic maintenance and applications of Failure Modes and Effects Analysis (FMEA) in semiconductor manufacturing
Failure Modes and Effects Analysis (FMEA) is considered as a systematic, learning retention vehicle in semiconductor manufacturing. This paper tries to set up a quantized evaluation approach on FMEA effectiveness for the first time and also presents a systematic maintenance method of FMEA in Foundry (FAB) to instead of traditional paper works which realizes intelligent maintenance to increase the timeliness and accuracy of FMEA. And, cross system applications between e-FMEA system and other FAB manufacture and monitor systems are presented to show the effectiveness improve after systematization.