硅应变片的光灵敏度

D. A. Gorham, B. Pickthorne
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引用次数: 0

摘要

典型的,商用的,硅应变片暴露在高强度氙气闪光源的响应已经测量。在金属-半导体接触处发展光伏,也有块体电导率的调制。这种电导率变化是相反的符号为p型和n型压力表,是由于热和光学效应的组合。这些结果是一个预防性的提醒,在某些应用中,响应的大小可能是显著的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Light sensitivity of silicon strain gauges
The response of typical, commercial, silicon strain gauges exposed to a high intensity xenon flash source has been measured. Photovoltages are developed at the metal-semiconductor contacts and there is also a modulation of bulk conductivity. This conductivity change is of opposite sign for p-type and n-type gauges, and is due to a combination of thermal and optical effects. These results are a precautionary reminder that the magnitude of the response may be significant in some applications.
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