{"title":"硅应变片的光灵敏度","authors":"D. A. Gorham, B. Pickthorne","doi":"10.1088/0022-3735/22/12/014","DOIUrl":null,"url":null,"abstract":"The response of typical, commercial, silicon strain gauges exposed to a high intensity xenon flash source has been measured. Photovoltages are developed at the metal-semiconductor contacts and there is also a modulation of bulk conductivity. This conductivity change is of opposite sign for p-type and n-type gauges, and is due to a combination of thermal and optical effects. These results are a precautionary reminder that the magnitude of the response may be significant in some applications.","PeriodicalId":16791,"journal":{"name":"Journal of Physics E: Scientific Instruments","volume":"37 1","pages":"1023-1025"},"PeriodicalIF":0.0000,"publicationDate":"1989-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Light sensitivity of silicon strain gauges\",\"authors\":\"D. A. Gorham, B. Pickthorne\",\"doi\":\"10.1088/0022-3735/22/12/014\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The response of typical, commercial, silicon strain gauges exposed to a high intensity xenon flash source has been measured. Photovoltages are developed at the metal-semiconductor contacts and there is also a modulation of bulk conductivity. This conductivity change is of opposite sign for p-type and n-type gauges, and is due to a combination of thermal and optical effects. These results are a precautionary reminder that the magnitude of the response may be significant in some applications.\",\"PeriodicalId\":16791,\"journal\":{\"name\":\"Journal of Physics E: Scientific Instruments\",\"volume\":\"37 1\",\"pages\":\"1023-1025\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1989-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of Physics E: Scientific Instruments\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1088/0022-3735/22/12/014\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Physics E: Scientific Instruments","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1088/0022-3735/22/12/014","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
The response of typical, commercial, silicon strain gauges exposed to a high intensity xenon flash source has been measured. Photovoltages are developed at the metal-semiconductor contacts and there is also a modulation of bulk conductivity. This conductivity change is of opposite sign for p-type and n-type gauges, and is due to a combination of thermal and optical effects. These results are a precautionary reminder that the magnitude of the response may be significant in some applications.