{"title":"导致G*类寿命分布的冲击模型","authors":"K. V. Jayamol, K. K. Jose","doi":"10.15406/bbij.2020.09.00301","DOIUrl":null,"url":null,"abstract":"In this paper we study a stochastic ordering namely alternate probability generating function (a.p.g.f .... ) ordering and its properties. The life distribution H(t) of a device subject to shocks governed by a Poisson process is considered as a function of the probabilities Pk of surviving the first k shocks. Various properties of the discrete failure distribution Pk are shown to be reflected in corresponding properties of the continuous life distribution H(t). A certain cumulative damage model and various applications of these models in reliability modeling are also considered.","PeriodicalId":90455,"journal":{"name":"Biometrics & biostatistics international journal","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2020-04-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Shock models leading to G* class of lifetime distributions\",\"authors\":\"K. V. Jayamol, K. K. Jose\",\"doi\":\"10.15406/bbij.2020.09.00301\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper we study a stochastic ordering namely alternate probability generating function (a.p.g.f .... ) ordering and its properties. The life distribution H(t) of a device subject to shocks governed by a Poisson process is considered as a function of the probabilities Pk of surviving the first k shocks. Various properties of the discrete failure distribution Pk are shown to be reflected in corresponding properties of the continuous life distribution H(t). A certain cumulative damage model and various applications of these models in reliability modeling are also considered.\",\"PeriodicalId\":90455,\"journal\":{\"name\":\"Biometrics & biostatistics international journal\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-04-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Biometrics & biostatistics international journal\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.15406/bbij.2020.09.00301\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Biometrics & biostatistics international journal","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.15406/bbij.2020.09.00301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Shock models leading to G* class of lifetime distributions
In this paper we study a stochastic ordering namely alternate probability generating function (a.p.g.f .... ) ordering and its properties. The life distribution H(t) of a device subject to shocks governed by a Poisson process is considered as a function of the probabilities Pk of surviving the first k shocks. Various properties of the discrete failure distribution Pk are shown to be reflected in corresponding properties of the continuous life distribution H(t). A certain cumulative damage model and various applications of these models in reliability modeling are also considered.