{"title":"低压开关柜大电流内弧的研究进展","authors":"S. Finke, D. Koenig","doi":"10.1109/ELINSL.2002.995945","DOIUrl":null,"url":null,"abstract":"This paper presents the results of tests to evaluate the effects of high current fault arcs occurring in electrical switchgear compartments stressing insulating walls made of different materials. These partitions are stressed mechanically and thermally. Additionally, a new effect is found which is described in this paper.","PeriodicalId":10532,"journal":{"name":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","volume":"66 1","pages":"336-340"},"PeriodicalIF":0.0000,"publicationDate":"2002-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Recent investigations on high current internal arcs in low voltage switchgear\",\"authors\":\"S. Finke, D. Koenig\",\"doi\":\"10.1109/ELINSL.2002.995945\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents the results of tests to evaluate the effects of high current fault arcs occurring in electrical switchgear compartments stressing insulating walls made of different materials. These partitions are stressed mechanically and thermally. Additionally, a new effect is found which is described in this paper.\",\"PeriodicalId\":10532,\"journal\":{\"name\":\"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)\",\"volume\":\"66 1\",\"pages\":\"336-340\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2002-04-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ELINSL.2002.995945\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Record of the the 2002 IEEE International Symposium on Electrical Insulation (Cat. No.02CH37316)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ELINSL.2002.995945","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Recent investigations on high current internal arcs in low voltage switchgear
This paper presents the results of tests to evaluate the effects of high current fault arcs occurring in electrical switchgear compartments stressing insulating walls made of different materials. These partitions are stressed mechanically and thermally. Additionally, a new effect is found which is described in this paper.