{"title":"MICHELLE-eBEAM中高平均电流和高束电荷光束的建模","authors":"S. Ovtchinnikov, J. Petillo, B. Koltenbah","doi":"10.1109/PLASMA.2014.7012533","DOIUrl":null,"url":null,"abstract":"The MICHELLE-eBEAM code has been employed successfully for modeling high average current and high bunch charge beams using a time-dependent model. Accurate particle tracking with self-consistent space charge and image forces is important in modeling detailed phase space evolution of high charge electron bunches. The MICHELLE-eBEAM code presents a promising solution where the model resolution only depends on the number of particles modeled and the detailed phase space evolution is enabled by accurate Coulomb calculations facilitated by a GPU-based tree algorithm. In this paper we report on our latest progress and show validation and benchmarking results.","PeriodicalId":88890,"journal":{"name":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","volume":"1 1","pages":"141-142"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Modeling high average current and high bunch charge beams in MICHELLE-eBEAM\",\"authors\":\"S. Ovtchinnikov, J. Petillo, B. Koltenbah\",\"doi\":\"10.1109/PLASMA.2014.7012533\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The MICHELLE-eBEAM code has been employed successfully for modeling high average current and high bunch charge beams using a time-dependent model. Accurate particle tracking with self-consistent space charge and image forces is important in modeling detailed phase space evolution of high charge electron bunches. The MICHELLE-eBEAM code presents a promising solution where the model resolution only depends on the number of particles modeled and the detailed phase space evolution is enabled by accurate Coulomb calculations facilitated by a GPU-based tree algorithm. In this paper we report on our latest progress and show validation and benchmarking results.\",\"PeriodicalId\":88890,\"journal\":{\"name\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"volume\":\"1 1\",\"pages\":\"141-142\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PLASMA.2014.7012533\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PLASMA.2014.7012533","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Modeling high average current and high bunch charge beams in MICHELLE-eBEAM
The MICHELLE-eBEAM code has been employed successfully for modeling high average current and high bunch charge beams using a time-dependent model. Accurate particle tracking with self-consistent space charge and image forces is important in modeling detailed phase space evolution of high charge electron bunches. The MICHELLE-eBEAM code presents a promising solution where the model resolution only depends on the number of particles modeled and the detailed phase space evolution is enabled by accurate Coulomb calculations facilitated by a GPU-based tree algorithm. In this paper we report on our latest progress and show validation and benchmarking results.