不同组件结构封装后发射极双面硅异质结太阳能电池的电位诱导降解机理

O. A. Arruti, Luca Gnocchi, Q. Jeangros, A. Virtuani, C. Ballif
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引用次数: 2

摘要

近年来的研究表明,硅异质结(SHJ)太阳能电池在被醋酸乙烯酯(EVA)封装后容易发生电位诱导降解(PID)。在这里,为了了解EVA的作用,我们在潮湿条件下(85°C/85% RH)在负偏置(-1000V)下进行PID测试。通过采用不同的模块结构,研究了吸湿和覆盖材料的影响。经过500小时的测试(相当于相应IEC标准预期持续时间的约5倍),我们专注于研究玻璃/玻璃方案封装模块的电池两面。前部的退化主要是由短路电流(JSC)的减少所决定的,而后部的退化则是由填充因子(FF)的损耗所驱动的。EQE测量结果表明,前表面复合的增加是导致前侧面退化的主要原因。从TEM和EDX测量来看,电池级的降解似乎主要是由钠扩散到电池中引起的,这是由湿度和低封装剂电阻率引发的。假设Na也聚集在细胞的后侧,这将在p-n结处产生缺陷,导致观察到的FF的损失。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Potential Induced Degradation Mechanism in Rear-Emitter Bifacial Silicon Heterojunction Solar Cells Encapsulated in Different Module Structures
Recent studies showed that silicon heterojunction (SHJ) solar cells can be prone to potential induced degradation (PID) when encapsulated with ethylene vinyl acetate (EVA). Here, to gain understanding in the role of EVA, we perform PID test in humid conditions (85°C/85% RH) under a negative bias (-1000V). We study the effect of moisture ingress and cover materials by using different module structures. We focus on studying both sides of the cell for modules packaged in a glass/glass scheme after 500 hours of test (corresponding to ~5 times the duration foreseen by the corresponding IEC standard). The front-side degradation is dominated by a reduction in short-circuit current (JSC), whereas the rear-side degradation is driven by a loss in fill factor (FF). EQE measurements show that increased front-surface recombination is largely responsible for the observed degradation of the front-side. From TEM and EDX measurements, it seems that the degradation at the cell level is predominantly caused by diffusion of sodium into the cell, which is triggered by humidity and low encapsulant resistivity. Assuming that the Na is also accumulated at the rear-side of the cell, this would create defects at the p-n junction, leading to the loss of FF observed.
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