M. Varonen, K. Cleary, D. Karaca, Kari A. I. Halonerr
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引用次数: 5
摘要
在本文中,我们报道了一种覆盖至少75至115 GHz频率范围的低温冷却CMOS放大器。放大芯片采用2S-nm FD SOI CMOS工艺制作。当低温冷却至20 K并在片上测量时,CMOS放大器显示lOS-ISS K噪声温度为75至115 GHz。这意味着噪声温度比室温噪声高6到8倍。测量的小信号增益约为20db。据作者所知,这是迄今为止报道的毫米波CMOS放大器和w波段最低CMOS LNA噪声温度的首次低温测量。
In this paper we report a cryogenically cooled CMOS amplifier covering at least 75 to 115 GHz frequency range. The amplifier chip was fabricated in 2S-nm FD SOI CMOS technology. When cryogenically cooled to 20 K and measured on-wafer the CMOS amplifier shows lOS-ISS K noise temperature from 75 to 115 GHz. This means 6 to 8 times improvement in noise temperature compared to room temperature noise. The measured small-signal gain is around 20 dB. To the best of authors' knowledge, these are the first cryogenic measurements of millimeter-wave CMOS amplifiers and lowest CMOS LNA noise temperatures for W-Band reported to date.