硅树脂绝缘体的疏水性恢复:仔细观察测试

Nancy E. Frost, Krenceski
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引用次数: 0

摘要

基于硅树脂聚合物的高压绝缘体在放电后迅速返回疏水表面具有固有的优势。这项工作描述了对影响表面击穿水平的因素(电晕放电时间、强度、应用距离)以及随后的恢复评估(接触角测量技术、操作员)的仔细审查。采用六西格玛工具确定影响试验结果的因素。可重复性和可重复性研究确定了设备和操作人员对测试结果的贡献。通过控制关键仪器和测试方法参数,可以开发一种新的分析模型来预测恢复疏水行为的时间,这在配方开发测试中很有用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Hydrophobicity recovery in silicone insulators: a closer look at testing
Silicone polymer-based high voltage insulators enjoy an inherent advantage in their rapid return to a hydrophobic surface after electrical discharge. This work describes a close scrutiny of the factors that influence the level of surface breakdown (corona discharge time, intensity, distance of application) as well as the subsequent evaluation of the recovery (contact angle measurement technique, operator). Six sigma tools were used to identify the factors influencing test results. A reproducibility and repeatability study identified the contribution of the equipment and operator to the test results. By controlling key instrument and test method parameters, it was possible to develop a novel analysis model to predict the time to return to hydrophobic behavior that is useful in formulation development testing.
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