P. Petrashin, W. Lancioni, Agustin Laprovitta, J. Castagnola
{"title":"OBIST结构嵌入式辐射传感器在混合信号系统中的应用","authors":"P. Petrashin, W. Lancioni, Agustin Laprovitta, J. Castagnola","doi":"10.12962/jaree.v5i2.194","DOIUrl":null,"url":null,"abstract":"Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.","PeriodicalId":32708,"journal":{"name":"JAREE Journal on Advanced Research in Electrical Engineering","volume":"80 1","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2021-10-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Embedded Radiation sensor with OBIST structure for applications in mixed signal systems\",\"authors\":\"P. Petrashin, W. Lancioni, Agustin Laprovitta, J. Castagnola\",\"doi\":\"10.12962/jaree.v5i2.194\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.\",\"PeriodicalId\":32708,\"journal\":{\"name\":\"JAREE Journal on Advanced Research in Electrical Engineering\",\"volume\":\"80 1\",\"pages\":\"\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2021-10-05\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"JAREE Journal on Advanced Research in Electrical Engineering\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.12962/jaree.v5i2.194\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"JAREE Journal on Advanced Research in Electrical Engineering","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.12962/jaree.v5i2.194","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Embedded Radiation sensor with OBIST structure for applications in mixed signal systems
Oscillation based testing (OBT) has proven to be a simple and effective test strategy for numerous kind of circuits. In this work, OBT is applied to a radiation sensor to be used as a VLSI cell in embedded applications, implementing an oscillation built-in self-test (OBIST) structure. The oscillation condition is achieved by means of a minimally intrusive switched feedback loop and the response evaluation circuit can be included in a very simple way, minimizing the hardware overhead. The fault simulation indicates a fault coverage of 100% for the circuit under test.Keywords: fault simulation, mixed signal testing, OBIST, oscillation-based test, VLSI testing.
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