{"title":"一种针对长基准测试功率估计的跟踪压缩算法","authors":"A. Ayupov, S. Burns","doi":"10.1109/ICCAD.2011.6105406","DOIUrl":null,"url":null,"abstract":"This paper presents an algorithm for compressing long traces generated using RTL or other fast simulation. The compressed traces can be used by power analysis tools to estimate power on the original traces. We show that the length of the compressed trace is independent of the length of original trace and is a function of circuit size (precisely, its active part) for which the trace was generated. Our experiments show up to 578× compression ratio on several long RTL traces (up to 320,000 clock transitions) used for power analysis on three industrial blocks (4K, 114K and 202K gates). This leads to significant runtime improvement, especially when the traces are reused over multiple power analysis runs. The dynamic power estimated using compressed traces is within 5% of the power analysis on original traces.","PeriodicalId":6357,"journal":{"name":"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2011-11-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A trace compression algorithm targeting power estimation of long benchmarks\",\"authors\":\"A. Ayupov, S. Burns\",\"doi\":\"10.1109/ICCAD.2011.6105406\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an algorithm for compressing long traces generated using RTL or other fast simulation. The compressed traces can be used by power analysis tools to estimate power on the original traces. We show that the length of the compressed trace is independent of the length of original trace and is a function of circuit size (precisely, its active part) for which the trace was generated. Our experiments show up to 578× compression ratio on several long RTL traces (up to 320,000 clock transitions) used for power analysis on three industrial blocks (4K, 114K and 202K gates). This leads to significant runtime improvement, especially when the traces are reused over multiple power analysis runs. The dynamic power estimated using compressed traces is within 5% of the power analysis on original traces.\",\"PeriodicalId\":6357,\"journal\":{\"name\":\"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-11-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.2011.6105406\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE/ACM International Conference on Computer-Aided Design (ICCAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.2011.6105406","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A trace compression algorithm targeting power estimation of long benchmarks
This paper presents an algorithm for compressing long traces generated using RTL or other fast simulation. The compressed traces can be used by power analysis tools to estimate power on the original traces. We show that the length of the compressed trace is independent of the length of original trace and is a function of circuit size (precisely, its active part) for which the trace was generated. Our experiments show up to 578× compression ratio on several long RTL traces (up to 320,000 clock transitions) used for power analysis on three industrial blocks (4K, 114K and 202K gates). This leads to significant runtime improvement, especially when the traces are reused over multiple power analysis runs. The dynamic power estimated using compressed traces is within 5% of the power analysis on original traces.
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