在高功率因数解决方案中测试GaN HEMT性能

F. Levati
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引用次数: 0

摘要

本文展示了用于交直流高功率因数变换器的氮化镓(GaN)高电子迁移率晶体管(HEMT)与硅超结SJ MOSFET的头对头实验结果的比较。本文考虑了三种变频变换器:过渡模式功率因数校正升压、准谐振高功率因数反激、准谐振高功率因数降压升压。为了充分评估GaN HEMT的优势,我们使用了一个没有频率限制功能的控制器。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Testing GaN HEMT Performance in High Power Factor Solutions
This document shows the experimental results of a head-to-head Gallium Nitride (GaN) High Electron Mobility Transistor (HEMT) versus Silicon Superjunction SJ MOSFET comparison used in ac-dc high power factor converters. Three variable-frequency converters have been considered: Transition Mode Power Factor Corrector boost, Quasi resonant High-Power Factor flyback, Quasi resonant high-power factor buck-boost. To fully assess the benefits of GaN HEMT, a controller with no frequency limitation function has been used.
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