金、铜线键合无铅封装不同电磁兼容及预镀引线框架表面组合的附着性及可靠性研究

April Joy H. Garete, Shwu Miin Tan, Weimei Cai, Zhiwen Li
{"title":"金、铜线键合无铅封装不同电磁兼容及预镀引线框架表面组合的附着性及可靠性研究","authors":"April Joy H. Garete, Shwu Miin Tan, Weimei Cai, Zhiwen Li","doi":"10.1109/IMPACT56280.2022.9966695","DOIUrl":null,"url":null,"abstract":"In this study, different molding compounds and pre-plated leadframe surface combinations were characterized in terms of adhesion and its impact on package delamination. Furthermore, Au and Cu wire bonded devices assembled using different EMC and leadframe surface treatment combinations were also assessed to evaluate the quality and reliability performance of these BOM as packaging materials for a DFN package. Key features of the different molding compound materials investigated in this study includes advanced formulation for improved delamination resistance, better fluidity, and copper wire compatibility. Full material characterization was conducted to compare the physical and thermo-mechanical properties of the EMCs. Button shear test on standard and rough pre-plated lead frame surfaces and tab pull test on PPF, Au and Cu substrates were performed to compare the interfacial adhesion performance and typical shear failure modes of various molding compounds. Adhesion data was further supported by subjecting the assembled of DFN package with different BOM combination to Moisture Sensitivity Level 1 (MSLI). Scanning Acoustic Microscopy (SAM) was then used to check the delamination performance on all mold interfaces at zero hour and after MSLI. The delamination level difference between samples built with different EMC types and pre-plated leadframe combinations were summarized in this study. A 23um diameter Au-wire and Cu-wire bonded transistor was used as test vehicle to evaluate the material reliability performance on package level. Moldability check was done to inspect any external voids, incomplete fill, or wire sweep occurrence for all BOM combinations. Reliability performance was assessed by subjecting the assembled units to 1000 cycles Temperature Cycling Test (TCT), 96 hours Highly Accelerated Stress Test (HAST), and 1000 hours High Temperature Reverse Bias (HTRB) at a junction temperature of 150°C. Overall, the material study was able to successfully assess the adhesion, moldability, delamination and reliability performance of different molding compounds and pre-plated leadframe combinations on Au-wire and Cu-wire bonded DFN package.","PeriodicalId":13517,"journal":{"name":"Impact","volume":"1 1","pages":"1-4"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Adhesion and Reliability Study of Different EMC and Pre-plated Leadframe Surface Combination for Au and Cu Wire Bonded Leadless Package\",\"authors\":\"April Joy H. Garete, Shwu Miin Tan, Weimei Cai, Zhiwen Li\",\"doi\":\"10.1109/IMPACT56280.2022.9966695\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this study, different molding compounds and pre-plated leadframe surface combinations were characterized in terms of adhesion and its impact on package delamination. Furthermore, Au and Cu wire bonded devices assembled using different EMC and leadframe surface treatment combinations were also assessed to evaluate the quality and reliability performance of these BOM as packaging materials for a DFN package. Key features of the different molding compound materials investigated in this study includes advanced formulation for improved delamination resistance, better fluidity, and copper wire compatibility. Full material characterization was conducted to compare the physical and thermo-mechanical properties of the EMCs. Button shear test on standard and rough pre-plated lead frame surfaces and tab pull test on PPF, Au and Cu substrates were performed to compare the interfacial adhesion performance and typical shear failure modes of various molding compounds. Adhesion data was further supported by subjecting the assembled of DFN package with different BOM combination to Moisture Sensitivity Level 1 (MSLI). Scanning Acoustic Microscopy (SAM) was then used to check the delamination performance on all mold interfaces at zero hour and after MSLI. The delamination level difference between samples built with different EMC types and pre-plated leadframe combinations were summarized in this study. A 23um diameter Au-wire and Cu-wire bonded transistor was used as test vehicle to evaluate the material reliability performance on package level. Moldability check was done to inspect any external voids, incomplete fill, or wire sweep occurrence for all BOM combinations. Reliability performance was assessed by subjecting the assembled units to 1000 cycles Temperature Cycling Test (TCT), 96 hours Highly Accelerated Stress Test (HAST), and 1000 hours High Temperature Reverse Bias (HTRB) at a junction temperature of 150°C. Overall, the material study was able to successfully assess the adhesion, moldability, delamination and reliability performance of different molding compounds and pre-plated leadframe combinations on Au-wire and Cu-wire bonded DFN package.\",\"PeriodicalId\":13517,\"journal\":{\"name\":\"Impact\",\"volume\":\"1 1\",\"pages\":\"1-4\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-26\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Impact\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMPACT56280.2022.9966695\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Impact","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMPACT56280.2022.9966695","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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摘要

在这项研究中,不同的成型化合物和预镀引线框架表面组合在附着力及其对封装分层的影响方面进行了表征。此外,还对采用不同EMC和引线框架表面处理组合组装的Au和Cu线键合器件进行了评估,以评估这些BOM作为DFN封装材料的质量和可靠性性能。本研究中研究的不同成型复合材料的主要特点包括先进的配方,可改善分层阻力,更好的流动性和铜线兼容性。进行了全面的材料表征,比较了EMCs的物理和热机械性能。通过对标准和粗糙预镀引线框架表面进行按钮剪切试验,以及对PPF、Au和Cu基底进行标签拉拔试验,比较不同成型化合物的界面粘附性能和典型剪切破坏模式。通过对不同BOM组合的DFN封装进行1级湿气敏感性(MSLI)测试,进一步支持附着力数据。然后使用扫描声学显微镜(SAM)检查在零小时和MSLI后所有模具界面上的分层性能。本研究总结了不同电磁兼容类型和预镀引线框架组合构建样品的分层水平差异。以直径23um的金铜键合晶体管为试验载体,在封装级上对材料可靠性性能进行了评价。可塑性检查是为了检查所有BOM组合的任何外部空洞、不完整填充或钢丝扫线现象。通过在结温为150°C的条件下进行1000次温度循环测试(TCT)、96小时高加速应力测试(HAST)和1000小时高温反向偏置(HTRB),评估了组装单元的可靠性性能。总体而言,材料研究能够成功评估不同成型化合物和预镀引线框架组合在金线和铜线粘合DFN封装上的粘附性、可塑性、分层和可靠性性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Adhesion and Reliability Study of Different EMC and Pre-plated Leadframe Surface Combination for Au and Cu Wire Bonded Leadless Package
In this study, different molding compounds and pre-plated leadframe surface combinations were characterized in terms of adhesion and its impact on package delamination. Furthermore, Au and Cu wire bonded devices assembled using different EMC and leadframe surface treatment combinations were also assessed to evaluate the quality and reliability performance of these BOM as packaging materials for a DFN package. Key features of the different molding compound materials investigated in this study includes advanced formulation for improved delamination resistance, better fluidity, and copper wire compatibility. Full material characterization was conducted to compare the physical and thermo-mechanical properties of the EMCs. Button shear test on standard and rough pre-plated lead frame surfaces and tab pull test on PPF, Au and Cu substrates were performed to compare the interfacial adhesion performance and typical shear failure modes of various molding compounds. Adhesion data was further supported by subjecting the assembled of DFN package with different BOM combination to Moisture Sensitivity Level 1 (MSLI). Scanning Acoustic Microscopy (SAM) was then used to check the delamination performance on all mold interfaces at zero hour and after MSLI. The delamination level difference between samples built with different EMC types and pre-plated leadframe combinations were summarized in this study. A 23um diameter Au-wire and Cu-wire bonded transistor was used as test vehicle to evaluate the material reliability performance on package level. Moldability check was done to inspect any external voids, incomplete fill, or wire sweep occurrence for all BOM combinations. Reliability performance was assessed by subjecting the assembled units to 1000 cycles Temperature Cycling Test (TCT), 96 hours Highly Accelerated Stress Test (HAST), and 1000 hours High Temperature Reverse Bias (HTRB) at a junction temperature of 150°C. Overall, the material study was able to successfully assess the adhesion, moldability, delamination and reliability performance of different molding compounds and pre-plated leadframe combinations on Au-wire and Cu-wire bonded DFN package.
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