MAP二极管中主动等离子体源的形成

K. Lamppa, R. Stinnett, T. Renk, M. T. Crawford, John Greenly
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引用次数: 2

摘要

离子束表面处理(IBEST)项目正在探索使用离子束处理各种材料的表面。这些实验表明,该材料的耐蚀性有所提高。表面硬化、晶粒尺寸改性、抛光和表面清洁都可以使用脉冲0.4-0.8 MeV离子束,传输1-10 J/cm/sup / 2/。康奈尔大学开发的磁约束阳极等离子体(MAP)二极管产生的活性等离子体可用于处理材料表面。该二极管由一个快速抽气阀作为气体的来源,以产生所需的离子和两个电容驱动的b场。慢磁场用于电子绝缘,快磁场用于电离膨化气体,并在加速器脉冲之前将等离子体定位在阳极的适当空间位置。各子系统之间的相对时序是影响MAP二极管系统有效等离子体源产生的重要因素。使用Langmuir探针测量氢气在阳极环空的等离子体到达时间,对MAP二极管进行了表征。这些数据随后被用于确定MAP二极管在RHEPP-1加速器上的最佳工作点。MAP二极管系统以40%的效率(在二极管处测量)产生500 kV, 12 kA的离子束的操作已经被证明。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Active plasma source formation in the MAP diode
The ion beam surface treatment (IBEST) program is exploring using ion beams to treat the surface of a wide variety of materials. These experiments have shown that improved corrosion resistance. Surface hardening, grain size modification, polishing and surface cleaning can all be achieved using a pulsed 0.4-0.8 MeV ion beam delivering 1-10 J/cm/sup 2/. The magnetically-confined anode plasma (MAP) diode, developed at Cornell University, produces an active plasma which can be used to treat the surfaces of materials. The diode consists of a fast puff valve as the source of gas to produce the desired ions and two capacitively driven B-fields. A slow magnetic field is used for electron insulation and a fast field is used to both ionize the puffed gas and to position the plasma in the proper spatial location in the anode prior to the accelerator pulse. The relative timing between subsystems is an important factor in the effective production of the active plasma source for the MAP diode system. The MAP diode has been characterized using a Langmuir probe to measure plasma arrival times at the anode annulus for hydrogen gas. This data was then used to determine the optimum operating point for the MAP diode on RHEPP-1 accelerator shots. Operation of the MAP diode system to produce an ion beam of 500 kV, 12 kA with 40% efficiency (measured at the diode) has been demonstrated.
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