来自x射线目标的反向散射电子

IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference Pub Date : 2014-05-25 DOI:10.1109/PLASMA.2014.7012536

T. Bui, D. Hart, R. Ives

{"title":"来自x射线目标的反向散射电子","authors":"T. Bui, D. Hart, R. Ives","doi":"10.1109/PLASMA.2014.7012536","DOIUrl":null,"url":null,"abstract":"X-rays are radiated from a target when an electron beam is accelerated and collides it. When high energy electrons struck a metal target, significant backscattered electrons could be generated and reduce the image sharpness. This paper will describe the Monte Carlo algorithm to analyze backscattered electrons in Beam Optics Analyzer (BOA) and present simulation results of an X-ray tube. The results will be compared with experimental data.","PeriodicalId":88890,"journal":{"name":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","volume":"1 1","pages":"81-82"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Backscattered electrons from X-ray target\",\"authors\":\"T. Bui, D. Hart, R. Ives\",\"doi\":\"10.1109/PLASMA.2014.7012536\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"X-rays are radiated from a target when an electron beam is accelerated and collides it. When high energy electrons struck a metal target, significant backscattered electrons could be generated and reduce the image sharpness. This paper will describe the Monte Carlo algorithm to analyze backscattered electrons in Beam Optics Analyzer (BOA) and present simulation results of an X-ray tube. The results will be compared with experimental data.\",\"PeriodicalId\":88890,\"journal\":{\"name\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"volume\":\"1 1\",\"pages\":\"81-82\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-25\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/PLASMA.2014.7012536\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/PLASMA.2014.7012536","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 2

摘要

当电子束被加速并撞击目标时，就会从目标放射出x射线。当高能电子撞击金属目标时，会产生大量的背散射电子，降低图像的清晰度。本文介绍了用蒙特卡罗算法分析波束光学分析仪(BOA)中的背散射电子，并给出了一个x射线管的仿真结果。计算结果将与实验数据进行比较。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Backscattered electrons from X-ray target

X-rays are radiated from a target when an electron beam is accelerated and collides it. When high energy electrons struck a metal target, significant backscattered electrons could be generated and reduce the image sharpness. This paper will describe the Monte Carlo algorithm to analyze backscattered electrons in Beam Optics Analyzer (BOA) and present simulation results of an X-ray tube. The results will be compared with experimental data.

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IEEE International Vacuum Electronics Conference. International Vacuum Electronics Conference

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