{"title":"一个0.2 - 8 MS/s的10b柔性SAR ADC,实现0.35 - 2.5 fJ/反步,采用自淬动态偏置比较器","authors":"H. S. Bindra, A. Annema, S. Louwsma, B. Nauta","doi":"10.23919/VLSIC.2019.8778093","DOIUrl":null,"url":null,"abstract":"A 10b flexible SAR ADC is presented incorporating a self-quenched dynamic bias comparator and a self-triggered asynchronous delay line. The ADC is fabricated in 65nm CMOS, occupies 0.04mm2 and has an ENOB > 9bit and SFDR >66dB for sampling rates from 0.2 to 8MS/s at supply voltages respectively from 0.7V to 1.3V with a Walden FoM from 0.35 to 2.5fJ/conv-step. Keywords: SAR ADC, flexible, Walden Figure-of-Merit, SNDR, dynamic bias.","PeriodicalId":6707,"journal":{"name":"2019 Symposium on VLSI Circuits","volume":"20 1","pages":"C74-C75"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":"{\"title\":\"A 0.2 - 8 MS/s 10b flexible SAR ADC achieving 0.35 - 2.5 fJ/conv-step and using self-quenched dynamic bias comparator\",\"authors\":\"H. S. Bindra, A. Annema, S. Louwsma, B. Nauta\",\"doi\":\"10.23919/VLSIC.2019.8778093\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A 10b flexible SAR ADC is presented incorporating a self-quenched dynamic bias comparator and a self-triggered asynchronous delay line. The ADC is fabricated in 65nm CMOS, occupies 0.04mm2 and has an ENOB > 9bit and SFDR >66dB for sampling rates from 0.2 to 8MS/s at supply voltages respectively from 0.7V to 1.3V with a Walden FoM from 0.35 to 2.5fJ/conv-step. Keywords: SAR ADC, flexible, Walden Figure-of-Merit, SNDR, dynamic bias.\",\"PeriodicalId\":6707,\"journal\":{\"name\":\"2019 Symposium on VLSI Circuits\",\"volume\":\"20 1\",\"pages\":\"C74-C75\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2019-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"7\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2019 Symposium on VLSI Circuits\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.23919/VLSIC.2019.8778093\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 Symposium on VLSI Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/VLSIC.2019.8778093","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 0.2 - 8 MS/s 10b flexible SAR ADC achieving 0.35 - 2.5 fJ/conv-step and using self-quenched dynamic bias comparator
A 10b flexible SAR ADC is presented incorporating a self-quenched dynamic bias comparator and a self-triggered asynchronous delay line. The ADC is fabricated in 65nm CMOS, occupies 0.04mm2 and has an ENOB > 9bit and SFDR >66dB for sampling rates from 0.2 to 8MS/s at supply voltages respectively from 0.7V to 1.3V with a Walden FoM from 0.35 to 2.5fJ/conv-step. Keywords: SAR ADC, flexible, Walden Figure-of-Merit, SNDR, dynamic bias.