{"title":"一种用于裂变径迹分析的新型计算机自动化显微镜平台系统","authors":"Trevor A. Dumitru","doi":"10.1016/1359-0189(93)90198-I","DOIUrl":null,"url":null,"abstract":"<div><p>A new Macintosh<sup>TM</sup>-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, and file management within a single, well-integrated, user-friendly program environment. The system is based on a high-quality Kinetek<sup>TM</sup> aumated sanning stage that has found wide use in the microelectronics industry. A unique feature of the system is use of the digitizing tablet cursor to control most stage actions, resulting in a very intuitive and natural mode of operation, and faster and less tedious analysis of samples than with other automated systems.</p></div>","PeriodicalId":82207,"journal":{"name":"Nuclear Tracks And Radiation Measurements","volume":"21 4","pages":"Pages 575-580"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1016/1359-0189(93)90198-I","citationCount":"214","resultStr":"{\"title\":\"A new computer-automated microscope stage system for fission-track analysis\",\"authors\":\"Trevor A. Dumitru\",\"doi\":\"10.1016/1359-0189(93)90198-I\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"<div><p>A new Macintosh<sup>TM</sup>-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, and file management within a single, well-integrated, user-friendly program environment. The system is based on a high-quality Kinetek<sup>TM</sup> aumated sanning stage that has found wide use in the microelectronics industry. A unique feature of the system is use of the digitizing tablet cursor to control most stage actions, resulting in a very intuitive and natural mode of operation, and faster and less tedious analysis of samples than with other automated systems.</p></div>\",\"PeriodicalId\":82207,\"journal\":{\"name\":\"Nuclear Tracks And Radiation Measurements\",\"volume\":\"21 4\",\"pages\":\"Pages 575-580\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1993-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"https://sci-hub-pdf.com/10.1016/1359-0189(93)90198-I\",\"citationCount\":\"214\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Nuclear Tracks And Radiation Measurements\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://www.sciencedirect.com/science/article/pii/135901899390198I\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nuclear Tracks And Radiation Measurements","FirstCategoryId":"1085","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/135901899390198I","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A new computer-automated microscope stage system for fission-track analysis
A new MacintoshTM-controlled microscope stage and digitizing tablet system has been developed that automates external detector method grain-to-mica matching, track length measurement, slide scanning, object centering, and file management within a single, well-integrated, user-friendly program environment. The system is based on a high-quality KinetekTM aumated sanning stage that has found wide use in the microelectronics industry. A unique feature of the system is use of the digitizing tablet cursor to control most stage actions, resulting in a very intuitive and natural mode of operation, and faster and less tedious analysis of samples than with other automated systems.
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