{"title":"4×12 Gb/s 0.96 pJ/b/lane模拟- iir串扰对消和信号复用接收器,用于65nm CMOS单端I/ o","authors":"Taehyoun Oh, R. Harjani","doi":"10.1109/VLSIC.2012.6243829","DOIUrl":null,"url":null,"abstract":"A crosstalk cancellation and signal reutilization (XTCR) algorithm implemented with analog-IIR networks dramatically improves signal integrity across 4 closely-spaced single-ended PCB traces. The prototype XTCR design implemented in 65 nm CMOS improves the measured average horizontal and vertical-eye openings of the 4 channels by 37.5% and 26.4% at 10-8 BER, while consuming only 0.96 pJ/b/lane.","PeriodicalId":6347,"journal":{"name":"2012 Symposium on VLSI Circuits (VLSIC)","volume":"1 1","pages":"140-141"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"4×12 Gb/s 0.96 pJ/b/lane analog-IIR crosstalk cancellation and signal reutilization receiver for single-ended I/Os in 65 nm CMOS\",\"authors\":\"Taehyoun Oh, R. Harjani\",\"doi\":\"10.1109/VLSIC.2012.6243829\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A crosstalk cancellation and signal reutilization (XTCR) algorithm implemented with analog-IIR networks dramatically improves signal integrity across 4 closely-spaced single-ended PCB traces. The prototype XTCR design implemented in 65 nm CMOS improves the measured average horizontal and vertical-eye openings of the 4 channels by 37.5% and 26.4% at 10-8 BER, while consuming only 0.96 pJ/b/lane.\",\"PeriodicalId\":6347,\"journal\":{\"name\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"volume\":\"1 1\",\"pages\":\"140-141\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-06-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 Symposium on VLSI Circuits (VLSIC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/VLSIC.2012.6243829\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 Symposium on VLSI Circuits (VLSIC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSIC.2012.6243829","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
4×12 Gb/s 0.96 pJ/b/lane analog-IIR crosstalk cancellation and signal reutilization receiver for single-ended I/Os in 65 nm CMOS
A crosstalk cancellation and signal reutilization (XTCR) algorithm implemented with analog-IIR networks dramatically improves signal integrity across 4 closely-spaced single-ended PCB traces. The prototype XTCR design implemented in 65 nm CMOS improves the measured average horizontal and vertical-eye openings of the 4 channels by 37.5% and 26.4% at 10-8 BER, while consuming only 0.96 pJ/b/lane.